Hostname: page-component-78c5997874-j824f Total loading time: 0 Render date: 2024-11-06T06:21:06.354Z Has data issue: false hasContentIssue false
  • English
  • Français

Effects of Pressure on the Vibrational, Structural and Electronic Properties of C60 Powder and Thin Films

Published online by Cambridge University Press:  21 March 2011

S. C. Sharma ,
B. Ha ,
J. H. Rhee ,
Y. Li ,
D. Singh  and
R. Govinthasamy
S. C. Sharma
Affiliation:
Department of Physics and Materials Science &Engineering Program The University of Texas at Arlington, Arlington, TX 76019, USA
B. Ha
Affiliation:
Department of Physics and Materials Science &Engineering Program The University of Texas at Arlington, Arlington, TX 76019, USA
J. H. Rhee
Affiliation:
Department of Physics and Materials Science &Engineering Program The University of Texas at Arlington, Arlington, TX 76019, USA
Y. Li
Affiliation:
Department of Physics and Materials Science &Engineering Program The University of Texas at Arlington, Arlington, TX 76019, USA
D. Singh
Affiliation:
Department of Physics and Materials Science &Engineering Program The University of Texas at Arlington, Arlington, TX 76019, USA
R. Govinthasamy
Affiliation:
Department of Physics and Materials Science &Engineering Program The University of Texas at Arlington, Arlington, TX 76019, USA
Get access

Abstract

We present results from a study of the vibrational, structural, and electronic properties of C60 powder and thin films. Raman spectroscopy and diamond anvil cell have been used to study pressure dependence of the Raman active modes of C60 powder. The material undergoes structural phase transition between 9 and 15 GPa. Some of the Raman modes soften, while others harden with increasing pressure. Thin films of C60 and La-doped C60 have also been studied by using Raman scattering, x-ray diffraction, x-ray photoelectron spectroscopy and uv photoemission spectroscopy. Whereas the powder and La-doped C60 films exhibit fcc crystalline structure, the C60 film appears disordered. Further, we observe a significant difference in the electronic valence bands of the doped and undoped films.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 695: Symposium L – Thin Films: Stresses and Mechanical Properties IX , 2001 , L3.10.1
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Dresselhaus, M. S., Dresselhaus, G., and Eklund, P. C., “Science of Fullerenes and Carbon Nanotubes”, Academic Press, 1996, and references therein.Google Scholar
2. Solid State Physics, vol. 48, editors, Ehrenreich, H. and Spaepen, F., Academic Press, 1994.Google Scholar
3. Rao, A. M., Zhou, P., Wang, K., Hager, G. T., Holden, J. M., Wang, Y., Lee, W. T., Bi, X. X., Eklund, P. C., Cornett, D. S., Duncan, M. A., and Amster, I. J., Science, 259 (1993) 955.Google Scholar
4. Iwasa, Y., Arima, T., Fleming, R. M., Siegrist, T., Zhou, O., Haddon, R. C., Rothberg, L. J., Lyons, K. B., Carter, H. L. Jr, Hebard, A. F., Tycko, R., Dabbagh, G., Krajewski, J. J., Thomas, G. A., and Yagi, T., Science 264 (1994) 1570.Google Scholar
5. Jayaraman, A., Rev. Mod. Phys. 55 (1983) 65.Google Scholar
6. Hemley, R. J. and Ashcroft, N. W., Physics Today (August 1998) 26.Google Scholar
7.MER Corporation, Tucson, Arizona.Google Scholar
8. Mao, H. K., Bell, P. M., Shaner, J. W., and Steinberg, D. J., J. Appl. Phys. 49 (1978) 3276.Google Scholar
9. Snoke, D. W., Raptis, Y. S., and Syassen, K., Phys. Rev. B 45 (1992) 14419.Google Scholar
10. Regueiro, M. N., Mod. Phys. Lett. 6 (1992) 1153.Google Scholar
11. Regueiro, M. N., Marques, L., Hodeau, J. L., Bethoux, O., and Perroux, M., Phys. Rev. Lett. 74 (1995) 278.Google Scholar
12. Erwin, S. C. in “Buckminsterfullerenes”, edited by Billups, W. E. and Ciufolini, M. A., VCH Publishers, N. Y., 1993, p. 217 Google Scholar
13. Benning, P. J., Poirier, D. M., Ohno, T. R., Chen, Y., Jost, M. B., Stepniak, F., Kroll, G. H., Weaver, J. H., Fure, J., and Smalley, R. E., Phys. Rev. B 45 (1992) 6899.Google Scholar