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Effects of Potassium on the Adsorption and Reactions of Nitric Oxide on Silicon Surface

Published online by Cambridge University Press:  25 February 2011

Z. C. Ying
Affiliation:
Laboratory of Atomic and Solid State Physics and Materials Science Center Cornell University, Ithaca, New York, 14853
W. Ho
Affiliation:
Laboratory of Atomic and Solid State Physics and Materials Science Center Cornell University, Ithaca, New York, 14853
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Abstract

The adsorption, thermoreactions, and photoreactions of NO coadsorbed with K on Si(111)7×7 at 90 K have been studied and compared with the results obtained from the Kfree surface. The experiments were performed under ultra-high vacuum conditions using high resolution electron energy loss spectroscopy, work function change measurements, and mass spectrometry. NO adsorbs both molecularly and dissociatively on the K-free surface. Two molecular N–O stretching modes are observed at 188 and 225 meV. The concentration of these NO molecules on the surface decreases as the K exposure increases and vanishes at high K exposures. A new N–O stretching mode, attributed to adsorption of NO molecules on K clusters, is observed at 157 meV. After thermal heating or photon irradiation, the surface is covered with atomic O and N. The surface is more oxidized in the presence of K. A steady decrease in the photodesorption cross section is observed as the K exposure increases and is attributed to K-induced band structure changes.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

1 Aruga, T., Tochihara, H., and Murata, Y., Phys. Rev. Lett. 53, 372 (1984).Google Scholar
2 Soukiassian, P., Gentle, T.M., Bakshi, M.H., and Hurych, Z., J. Appl. Phys. 60, 4339 (1986); E.M. Oellig, E.G. Michel, M.C. Asensio, and R. Miranda, Appl. Phys. Lett. 50, 1660 (1987).Google Scholar
3 Soukiassian, P., Bakshi, M.H., Starnberg, H.I., Hurych, Z., Gentle, T.M., and Schuette, K.P., Phys. Rev. Lett. 59, 1488 (1987).Google Scholar
4 Chuang, T.J., Surf. Sci. Rep. 3, 1 (1983).Google Scholar
5 Ho, W., Comments Cond. Matter Phys. 13, 293 (1988).Google Scholar
6 Ying, Z. and Ho, W., Phys. Rev. Lett. 60, 57 (1988).Google Scholar
7 Ying, Z. and Ho, W., J. Vac. Sci. Technol. A 7, 000 (1989).Google Scholar
8 Ying, Z. and Ho, W., Surf. Sci. 198, 473 (1988).Google Scholar
9 So, S. K. (private communication).Google Scholar
10 Ekwelundu, E. and Ignatiev, A., Surf. Sci. 179, 119 (1987).Google Scholar
11 Many, A., Goldstein, Y., and Grover, N.B., Semiconductor surfaces (North-Holland, Amsterdam, 1965).Google Scholar