Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-25T17:42:24.835Z Has data issue: false hasContentIssue false

Effects of Chlorine on Dopant Activation in a-Si:H

Published online by Cambridge University Press:  15 February 2011

Adam M. Payne
Affiliation:
Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544
Sigurd Wagner
Affiliation:
Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544
Get access

Abstract

The incorporation of chlorine has a significant effect on the dark conductivity of doped and undoped hydrogenated amorphous silicon (a-Si:H). The dark conductivity of a-Si:H films deposited from dichlorosilane (SiCl2H2) and SiH4, and doped with diborane, increases by as much as a factor of 100 over the usual a-Si:H,B films deposited without SiCl2H2. The effect is observed at gas phase concentrations of diborane ranging from 0.006% to 0.5%, and for both DC and RF plasma depositions, although it is more noticeable for the DC discharge. An increase in dark conductivity is also observed in B doped a-Si,C:H films deposited with dichlorosilane, albeit coupled with a change in the Tauc gap. Chlorine reduces the conductivity of undoped and phosphorus doped a-Si:H films. Undoped a-Si:H films deposited from SiCl2H2 and SiH4 have a dark conductivity of ~1. 10-12 S.cm-1, which is an order of magnitude lower than films deposited from pure SiH4. We discuss several alternatives for the mechanism of chlorine enhanced or reduced dopant activation. We have made solar cells using chlorinated p-type a-SiC:H films as the p-layers.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Ovshinsky, R. and Madan, A., Nature 276, p 482 (1978).Google Scholar
2. Carlson, D. E. and Wronski, C. in Topics in Applied Physics, Volume 36, edited by Brodsky, M. H., pp. 310– (1979).Google Scholar
3. Bullock, J. N. and Wagner, S., Mater. Res. Soc. Symp. Proc. Volume 336, pp. 97– (1994).Google Scholar
4. Lee, Keun Soo, Choi, Jong Hyun, Kim, Sung Ki, Jeon, Hong Bin, and Jang, Jin, Applied Physics Letters 69 (16), p. 2403 (1996).Google Scholar
5. Nakata, Masami and Wagner, Sigurd, Applied Physics Letters 65 (15), pp. 1940 -- 42 (1994).Google Scholar
6. Payne, A.M. and Wagner, S., Mater. Res. Soc. Symp. Proc. Volume 420, pp. 883– (1996).Google Scholar
7. Payne, Adam, Crone, Brian, and Wagner, S., Mater. Res. Soc. Symp. Proc. Volume 467, p. 789 (1997)Google Scholar
8. Augelli, Vincenzo, Ligonzo, Teresa, Murri, Roberto, and Schiavulli, Luigi, Thin Solid Films 125, pp. 9– (1985).Google Scholar
9. Kim, Sung Ki, Moon, Byeong Yeon, Byun, Jae Seong, Jeon, Hong Bin, and Jang, Jin, Journal of Applied Physics 69 (8), p. 1131 (1996).Google Scholar
10. Jang, Jin, personal communication, August 1997.Google Scholar
11. Yamasaki, Satoshi, Matsuda, Akihisa, and Tanaka, Kazunobu, Japanese Journal of Applied Physics 21, part 2 Letters (12), pp. L789– (1982).Google Scholar
12. Bruno, Giovanni, Capezzuta, Pio, Cramarossa, Francesco, Babarossa, Vincenzo, Augelli, Vincenzo, and Murri, Roberto, Journal of Non-Crystalline Solids 59&60, pp. 815 - 18 (1983).Google Scholar
13. Delahoy, A.E. and Griffith, R. W., Journal of Applied Physics 52 (10), pp. 6337 -- 46 (1981).Google Scholar
14. Pankove, J.I., Carlson, D. E., Berkeyheiser, J. E., and Wance, R.O., Physical Review Letters 51 (24), pp. 2224 -- 25 (1983).Google Scholar
15. Fedders, Peter A. and Drabold, D. A., Journal of Non-Crystalline Solids 227–230, Pp. 376– (1998).Google Scholar