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Effect of Surface Coverage on Porous Silicon Photoluminescence: Transmission FTIR Studies

Published online by Cambridge University Press:  15 February 2011

M. B. Robinson ,
A. C. Dillon ,
D. R. Haynes  and
S. M. George
M. B. Robinson
Affiliation:
Dept. of Chemistry and Biochemistry, Univ. of Colorado, Boulder, CO. 80309
A. C. Dillon
Affiliation:
Dept. of Chemistry and Biochemistry, Univ. of Colorado, Boulder, CO. 80309
D. R. Haynes
Affiliation:
Dept. of Chemistry and Biochemistry, Univ. of Colorado, Boulder, CO. 80309
S. M. George
Affiliation:
Dept. of Chemistry and Biochemistry, Univ. of Colorado, Boulder, CO. 80309
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Abstract

Transmission Fourier Transform Infrared (FTIR) Spectroscopy was utilized to monitor the effect of surface coverage on photoluminescent porous silicon. These experiments were performed in situ in an ultrahigh vacuum (UHV) chamber to correlate simultaneously surface coverage and photoluminescence intensity. The goal of these FTIR and photoluminescence studies was to clarify the mechanism of the photoluminescence from porous silicon.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 256: Symposia AA – Light Emission from Silicon , 1991 , 17
Copyright
Copyright © Materials Research Society 1992

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References

1. Uhlir, A., Bell Syst. Tech. J. 35, 333 (1956).Google Scholar
2. Turner, D.R., J. Electrochem. Soc. 105, 402 (1958).CrossRefGoogle Scholar
3. Chuang, S.F., Collins, S.D. and Smith, R.L., Appl. Phys. Lett. 55 675 (1989).Google Scholar
4. Bomchil, G., Herino, R., Barla, K. and Pfister, J.C., J. Electrochem. Soc. 130 1611 (1983).Google Scholar
5. Hardeman, R.W., Beale, M.I.J., Gasson, D.B., Keen, J. M., Pickering, C. and Robbins, D.J., Surf. Sci. 152/153 1051 (1985).Google Scholar
6. Barla, K., Herino, R., Bomchil, G., Pfister, J.C. and Freund, A., J. Cryst. Growth 68 727 (1984).CrossRefGoogle Scholar
7. Gupta, P., Colvin, V.L. and George, S.M., Phys. Rev. L 7, 8234 (1988).Google Scholar
8. Gupta, P., Dillon, A.C., Bracker, A.S. and George, S.M., Surf. Sci. 245, 260 (1991).Google Scholar
9. Dillon, A.C., Gupta, P., Robinson, M.B., Bracker, A.S. and George, S.M., J. Vac. Sci. Technol. A 9, 2222 (1991).Google Scholar
10. Dillon, A.C., Robinson, M.B., Han, M.Y. and George, S.M. J. Electrochem. Soc. (in press).Google Scholar
11. Canham, L.T., Appl. Phys. Lett. 56, 1046 (1990).CrossRefGoogle Scholar
12. Lehmann, V. and Gosele, U., Appl. Phys. Lett. 58 856 (1991).Google Scholar
13. Halimaoui, A., Oules, C., Bomchill, G., Bsiesy, A., Gaspard, F., Herino, R., Ligeon, M. and Muller, F., Appl. Phys. Lett. 59, 304 (1991).Google Scholar
14. Cullis, A.G. and Canham, L.T., Nature 353, 335 (1991).Google Scholar
15. Bsiesy, A., Vial, J.C., Gaspard, F., Herino, R., Ligeon, M., Muller, F., Romestain, R., Wasiela, A., Halimaoui, A. and Bomchil, G., Surf. Sci. 254, 195 (1991).Google Scholar
16. Tsai, C., Li, K.H., Sarathy, J., Shih, S., Campbell, J.C., Hance, B.K. and White, J.M.(submitted Appl. Phys. Lett.).Google Scholar
17. Prokes, S.M., Glembocki, O.J., Bermudez, V.M., Kaplan, R., Friedersdorf, L.E. and Searson, P.C. (submitted to Phys. Rev. Lett.)Google Scholar