Hostname: page-component-cd9895bd7-p9bg8 Total loading time: 0 Render date: 2024-12-27T01:47:21.142Z Has data issue: false hasContentIssue false

Effect of substrate deformation in the nanowire/nanotube bending test

Published online by Cambridge University Press:  01 February 2011

Wingkin Chan
Affiliation:
Department of Mechanical Engineering, Hong Kong University of Science and Technology Clear Water Bay, Kowloon, Hong Kong, China
Yong Wang
Affiliation:
Department of Mechanical Engineering, Hong Kong University of Science and Technology Clear Water Bay, Kowloon, Hong Kong, China
Jianrong Li
Affiliation:
Department of Mechanical Engineering, Hong Kong University of Science and Technology Clear Water Bay, Kowloon, Hong Kong, China
Tong-Yi Zhang*
Affiliation:
Department of Mechanical Engineering, Hong Kong University of Science and Technology Clear Water Bay, Kowloon, Hong Kong, China
*
*Corresponding author, Tel: (852) 2358-7192, Fax: (852) 2358-1543, E-mail: [email protected]
Get access

Abstract

The present work analyses the effect of substrate deformation during the nanowire/nanotube bending test. An individual nanowire or nanotube is treated as a linear isotropic continuum. The substrate deformation is modeled by two coupled springs and the spring compliances arefunctions of the nanowire/nanotube diameter, and the Young moduli of the nanowire/nanotube and the substrates. An atomic potential is used to determine the adhesion between the nanowire/nanotube and its substrate. Consequently, a simple three dimensional Finite Element (FE) model is built to calculate the spring compliances. The load-displacement relation, which takes into account of substrate deformation, is derived in a closed form, which can be reduced to the load-displacement relations based on the simply-supported ends and the built-in ends. The numerical results indicate that the substrate deformation has a great influence on the determination of the Young modulus of a nanowire/nanotube from the bending test. The nanobridge test on carbon nanotubes is taken as an example to demonstrate the feasibility of the developed method.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Poncharal, P., Wang, Z.L., Ugarte, D., Heer, W.A. de, Science, 283, 15131516, (1999).Google Scholar
2 Dai, H., Hafner, J.H., Rinzler, A.G., Colbert, D.T., Smalley, R. E., Nature, 384, 147150, (1996).Google Scholar
3 Zhang, T.Y., Zhao, M.H., Qian, C.F., Journal of Material Research, 15, 18681871, (2000).Google Scholar
4 Zhang, T.Y., Su, Y.J., Qian, C.F., Zhao, M.H., Chen, L.Q.. Acta Materialia, 48, 28432857, (2000).Google Scholar
5 Xu, W.H., Zhang, T.Y., Applied Physics Letters, 83, 17311733, (2003).Google Scholar
6 Pantano, A., Parks, D.M., Boyce, M.C., Journal of the Mechanics and Physics of Solids, 52, 789821, (2004).Google Scholar
7 Gao, H. J., Yao, H. M., Proceedings of the National Academy of Sciences of the United State of America, 101, 78517856, (2004).Google Scholar
8 Johnson, K.L., Contact Mechanics, (Cambridge University Press, 1985).Google Scholar
9 Fung, Y.C., Foundations of Solid Mechanics, (Prentice-Hall, 1965).Google Scholar
10 Timoshenko, S., Woinowsky-Krieger, S., Theory of Plates and Shells, (McGraw-Hill, 1959).Google Scholar
11 Cuenot, S., Demoustier-Champagne, S., Nysten, B., Physical Review Letters, 85, 16901693, (2000).Google Scholar
12 Wang, X.S., Li, J.R., Zhang, T.Y., Microbridge testing on asymmetrical trilayer films, (unpublished).Google Scholar
13 Salvetat, J.P., Kulik, A.J., Bonard, J.M., Briggs, G.A.D., Stöckli, T., Méténier, K., Bonnamy, S., Béguin, F., Burnham, N.A., Forró, L., Advanced Materials, 11, 161165, (1999).Google Scholar