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Effect of substrate deformation in the nanowire/nanotube bending test

Published online by Cambridge University Press:  01 February 2011

Wingkin Chan
Affiliation:
Department of Mechanical Engineering, Hong Kong University of Science and Technology Clear Water Bay, Kowloon, Hong Kong, China
Yong Wang
Affiliation:
Department of Mechanical Engineering, Hong Kong University of Science and Technology Clear Water Bay, Kowloon, Hong Kong, China
Jianrong Li
Affiliation:
Department of Mechanical Engineering, Hong Kong University of Science and Technology Clear Water Bay, Kowloon, Hong Kong, China
Tong-Yi Zhang*
Affiliation:
Department of Mechanical Engineering, Hong Kong University of Science and Technology Clear Water Bay, Kowloon, Hong Kong, China
*
*Corresponding author, Tel: (852) 2358-7192, Fax: (852) 2358-1543, E-mail: [email protected]
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Abstract

The present work analyses the effect of substrate deformation during the nanowire/nanotube bending test. An individual nanowire or nanotube is treated as a linear isotropic continuum. The substrate deformation is modeled by two coupled springs and the spring compliances arefunctions of the nanowire/nanotube diameter, and the Young moduli of the nanowire/nanotube and the substrates. An atomic potential is used to determine the adhesion between the nanowire/nanotube and its substrate. Consequently, a simple three dimensional Finite Element (FE) model is built to calculate the spring compliances. The load-displacement relation, which takes into account of substrate deformation, is derived in a closed form, which can be reduced to the load-displacement relations based on the simply-supported ends and the built-in ends. The numerical results indicate that the substrate deformation has a great influence on the determination of the Young modulus of a nanowire/nanotube from the bending test. The nanobridge test on carbon nanotubes is taken as an example to demonstrate the feasibility of the developed method.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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