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Effect of Sidewall Fluorination on the Mechanical Properties of Catalytically Grown Multi-Wall Carbon Nanotubes

Published online by Cambridge University Press:  02 March 2011

Yogeeswaran Ganesan
Affiliation:
Department of Mechanical Engineering and Materials Science, Rice University, 6100 Main Street, Houston, TX, 77006
Cheng Peng
Affiliation:
Department of Mechanical Engineering and Materials Science, Rice University, 6100 Main Street, Houston, TX, 77006
Lijie Ci
Affiliation:
Department of Mechanical Engineering and Materials Science, Rice University, 6100 Main Street, Houston, TX, 77006
Valery Khabashesku
Affiliation:
Department of Chemical and Biomolecular Engineering, University of Houston, 4800 Calhoun Road, Houston, Texas, 77004
Pulickel M. Ajayan
Affiliation:
Department of Mechanical Engineering and Materials Science, Rice University, 6100 Main Street, Houston, TX, 77006
Jun Lou
Affiliation:
Department of Mechanical Engineering and Materials Science, Rice University, 6100 Main Street, Houston, TX, 77006
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Abstract

We report on the usage of a simple microfabricateddevice, that works in conjunction with a quantitative nanoindenter inside a scanning electron microscope (SEM), for the in situ quantitative tensile testing of individual sidewall fluorinated multi-wall carbon nanotubes (MWNTs). The stress vs. strain curves and the tensile strength values for five fluorinated specimens have been presented and compared to those of pristine MWNT specimens (data reported earlier). The fluorinated specimens were found to deform and fail in a brittle fashion similar to pristine MWNTs. However, sidewall fluorination was found to have considerably degraded the mechanical properties (tensile strength and load bearing capacity) of the MWNTs.

Type
Research Article
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Hamon, M. A., Hu, H., Bhowmik, P., Niyogi, S., Zhao, B., Itkis, M. E., Haddon, R. C., Chem. Phys. Lett., 347, 8 (2001).Google Scholar
2. Stevens, J. L., Huang, A. Y., Peng, H., Chiang, I. W., Khabashesku, V. N., Margrave, J. L., Nano Lett., 3, 331 (2003).Google Scholar
3. Balavoine, F., Schultz, P., Richard, C., Mallouh, V., Ebbesen, T. W., Mioskowski, C., Angew. Chem., 111, 2036 (1999).Google Scholar
4. Smith, B. W., Monthioux, M., Luzzi, D. E., Chem. Phys. Lett., 315, 31 (1999).Google Scholar
5. Mickelson, E. T., Huffman, C. B., Rinzler, A. G., Smalley, R. E., Hauge, R. H., Margrave, J. L., Chem. Phys. Lett., 296, 188 (1998).Google Scholar
6. Pekker, S., Salvelat, J.-P., Jakab, E., Bonard, J.-M., Forro, L. J., Phys. Chem. B, 105, 7938 (2001).Google Scholar
7. Bahr, J. L., Yang, J., Kosynkin, D. V., Bronikowski, M. J., Smalley, R. E., Tour, J. M., Am, J.. Chem. Soc., 123, 6536 (2001).Google Scholar
8. Bahr, J. L., Tour, J. M., Chem. Mater., 13, 3823 (2001).Google Scholar
9. Holzinger, M., Vostrowsky, O., Hirsch, A., Hennrich, F., Kappes, M., Weiss, R., Jellen, F., Angew. Chem., Int. Ed., 40, 4002 (2001).Google Scholar
10. Peng, H., Reverdy, P., Khabashesku, V. N., Margrave, J. L., Chem. Commun., 362 (2003).Google Scholar
11. Zhu, J., Kim, J., Peng, H., Margrave, J. L., Khabashesku, V. N., Barrera, E. V., Nano Lett., 3, 1107 (2003).Google Scholar
12. Ganesan, Y., Lu, Y., Peng, C., Lu, H., Ballarini, R. and Lou, J., JMEMS, 19, 675 (2010).Google Scholar
13. Ganesan, Y., Peng, C., Lu, Y., Ci, L., Srivastava, A., Ajayan, P. M. and Lou, J., ACS Nano, Published online (10.1021/nn102372w) (2010).Google Scholar
14. Yu, M.F., Lourie, O., Dyer, M.J., Moloni, K., Kelly, T.F. and Ruoff, R.S., Science 287, 637 (2000).Google Scholar
15. Khare, R., Mielke, S. L., Paci, J. T., Zhang, S., Ballarini, R., Schatz, G. C., Belytschko, T., Phys. Rev. Lett., 75, 075142 (2007).Google Scholar