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The Effect of Phosphorous on the Corrosion Resistance of Glassy Copper Zirconium Alloys

Published online by Cambridge University Press:  21 February 2011

T.D. Burleigh  and
R.M. Latanision
T.D. Burleigh
Affiliation:
The H.H. Uhlig Corrosion Laboratory, Department of Materials Science and Engineering, Room 8–202, Massachusetts Institute of Technology, Cambridge, MA 02139
R.M. Latanision
Affiliation:
The H.H. Uhlig Corrosion Laboratory, Department of Materials Science and Engineering, Room 8–202, Massachusetts Institute of Technology, Cambridge, MA 02139
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Abstract

Phosphorous has been shown to have a beneficial effect on reducing the corrosion rate of various metal alloys. This research was undertaken to determine by what mechanism the phosphorous is able to improve the corrosion resistance of metals. The amorphous copper-zirconium system was chosen for experimentation because the amorphous structure eliminates the complications due to crystalline defects. The zirconium forms zirconia (ZrO2), which is normally a protective surface oxide. Copper-zirconium alloys with and without phosphorous were melt-spun, and were tested in various electrolytes. In comparing Cu-42Zr-2P with Cu-4OZr, the results show that the corrosion rate of Cu-42Zr-2P is lower in 1N sulfuric acid, and significantly lower in 3.5 w/o NaCl, and in 1N HCl. ESCA analysis shows that phosphorous is present in the zirconia film, and has a valence of +5. Photocurrent experiments suggest that phosphorous alters the semiconductor properties of the zirconia film.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 28: Symposium F – Rapidly Solidified Metastable Materials , 1983 , 227
Copyright
Copyright © Materials Research Society 1984

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References

REFERENCES

1. Hashimoto, K., Supplement to Sci. Rep. RITU, 201–216 (1980).Google Scholar
2. Turn, J. C. Jr., Latanision, R. M., Corrosion, 39, 271–279 (1983).10.5006/1.3581912Google Scholar
3. Blodgett, K. B., Step Gauge for Measuring Thickness of Thin Films, U.S. Patent #2,587,282 (Feb. 26, 1952).Google Scholar