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The Effect of Interfacial Disorder on the X-Ray Diffraction of Superlattices

Published online by Cambridge University Press:  25 February 2011

J. P. Locquet
Affiliation:
Laboratorium voor Vaste Stof-Fysika en Magnetisme, Katholieke Universiteit Leuven, B-3030 Leuven, Belgium
D. Neerinck
Affiliation:
Laboratorium voor Vaste Stof-Fysika en Magnetisme, Katholieke Universiteit Leuven, B-3030 Leuven, Belgium
W. Sevenhans
Affiliation:
Laboratorium voor Vaste Stof-Fysika en Magnetisme, Katholieke Universiteit Leuven, B-3030 Leuven, Belgium
Y. Bruynseraede
Affiliation:
Laboratorium voor Vaste Stof-Fysika en Magnetisme, Katholieke Universiteit Leuven, B-3030 Leuven, Belgium
H. Homma
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, U.S.A.
Ivan K. Schuller
Affiliation:
Physics Department-B019, University of California - San Diego, Lajolla, California 92093, U.S.A.
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Abstract

We have generalised our x-ray diffraction results from amorphous/crystalline multilayers, to include random interfacial disorder of a gaussian type. A general relation is obtained which can be applied to both crystalline/crystalline and crystalline/amorphous multilayers. This gaussian fluctuation or “roughness” can strongly reduce the long-range atomic order along the growth direction of the multilayer. Using classical structure factor calculations, we simulate the evolution of x-ray patterns as a function of the fluctuation amplitude, the superlattice wavelength, and the interatomic distances. Applying this model to the crystalline/crystalline case we fit the experimental Nb/Cu data, deduce a fluctuation amplitude of about 0.4 Å, and relate it to the lattice mismatch between Nb and Cu. For crystalline/amorphous systems (Pb/Ge) this amplitude can be significantly larger (2 Å).

Type
Research Article
Copyright
Copyright © Materials Research Society 1988

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References

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