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Effect of doping on crystalline quality of rubidium titanyl phosphate (RTP) crystals grown by the TSSG method

Published online by Cambridge University Press:  09 October 2014

Jianqiu Guo
Affiliation:
Department of Materials Science and Engineering, Stony Brook University, Stony Brook, NY 11794, USA
Balaji Raghothamachar
Affiliation:
Department of Materials Science and Engineering, Stony Brook University, Stony Brook, NY 11794, USA
Michael Dudley
Affiliation:
Department of Materials Science and Engineering, Stony Brook University, Stony Brook, NY 11794, USA
Joan J. Carvajal
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Ali Butt
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Maria Cinta Pujol
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Rosam M Sole
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Jaume Massons
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Magdalena Aguilo
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
Francesc Diaz
Affiliation:
Physics and Crystallography of Materials and Nanomaterials (FiCMA-FiCNA), Universitat Rovira i Virgili (URV), Campus Sescelades, c/Marcel·lí Domingo s/n, E-43007 Tarragona, Spain
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Abstract

Defect structures in Rubidium Titanyl Phosphate (RTP) crystals (non-doped and doped) grown by the Top Seeded Solution Growth (TSSG) method were characterized using Synchrotron White Beam X-ray Topography. Main defects observed in non-doped crystals are growth sector boundaries while both growth sector boundaries and growth striations are observed in the Nb single doped and (Nb,Yb)-codoped crystals with relatively few linear defects such as dislocations. Results show that the overall crystalline quality is lowered as more doping elements are incorporated. Details of defect distributions are correlated with the growth process to facilitate high quality growth of doped RTP.

Type
Articles
Copyright
Copyright © Materials Research Society 2014 

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References

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