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Effect of Alignment on Transport Properties of Carbon Nanotube/Metallic Junctions

Published online by Cambridge University Press:  15 February 2011

Buzz Wincheski ,
Min Namkung ,
Jan Smits ,
Phillip Williams  and
Robert Harvey
Buzz Wincheski
Affiliation:
NASA LaRC VA, 23681, U.S.A.
Min Namkung
Affiliation:
NASA LaRC VA, 23681, U.S.A.
Jan Smits
Affiliation:
Lockheed Hampton Martin Space Operation Hampton VA 23681, U.S.A.
Phillip Williams
Affiliation:
National Research Council Hampton VA, 23681, U.S.A.
Robert Harvey
Affiliation:
Christopher Newport University Newport News VA, 23606, U.S.A.
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Abstract

Ballistic and spin coherent transport in single walled carbon nanotubes (SWCNT) are predicted to enable high sensitivity single-nanotube devices for strain and magnetic field sensing. Based upon these phenomena, electron beam lithography procedures have been developed to study the transport properties of purified HiPCO single walled carbon nanotubes for development into sensory materials for nondestructive evaluation. Purified nanotubes are dispersed in solvent suspension and then deposited on the device substrate before metallic contacts are defined and deposited through electron beam lithography. This procedure produces randomly dispersed ropes, typically 2 – 20 nm in diameter, of single walled carbon nanotubes. Transport and scanning probe microscopy studies have shown a good correlation between the junction resistance and tube density, alignment, and contact quality. In order to improve nanotubes at specific locations on the substrate surface. Lithographic techniques are used to define local areas where high frequency electric fields are to be concentrated. Application of the aligned with the electric field lines. A second electron beam lithography layer is then used to deposit metallic contacts across the aligned tubes. Experimental measurements are presented showing the increased tube alignment and improvement in the transport properties of the junctions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 772: Symposium M – Nanotube-Based Devices , 2003 , M9.2
Copyright
Copyright © Materials Research Society 2003

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