Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-23T09:23:22.147Z Has data issue: false hasContentIssue false
  • English
  • Français

Dynamic investigation of defects induced by short, high current pulses of high energy lithium ions

Published online by Cambridge University Press:  08 September 2014

Hua Guo ,
Arun Persaud ,
Steve Lidia ,
Andrew M. Minor ,
P. Hosemann ,
Peter A. Seidl  and
Thomas Schenkel
Hua Guo
Affiliation:
Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA Department of Materials Science and Engineering, University of California, Berkeley, CA 94720, USA
Arun Persaud
Affiliation:
Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA
Steve Lidia
Affiliation:
Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA
Andrew M. Minor
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA Department of Materials Science and Engineering, University of California, Berkeley, CA 94720, USA
P. Hosemann
Affiliation:
Materials Sciences Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA Nuclear Engineering Department, University of California, Berkeley, CA 94720, USA
Peter A. Seidl
Affiliation:
Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA
Thomas Schenkel
Affiliation:
Accelerator and Fusion Research Division, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA
Get access

Abstract

We employ intense and short pulses of energetic lithium (Li+) ions to investigate the relaxation dynamics of radiation induced defects in single crystal silicon samples. Ions both create damage and track damage evolution simultaneously at short time scales when we use the channeling effect as a diagnostic tool. Ion pulses, ∼20 to 600 ns long and with peak currents of up to ∼1 A are formed in an induction type linear accelerator, the Neutralized Drift Compression eXperiment at Lawrence Berkeley National Laboratory. By rotating silicon (<100>) membranes of different thicknesses and changing the incident ion energy, the fraction of channeled ions in the transmitted beam could be varied. In preliminary experiments we find that the Li ion intensity is not high enough to generate overlapping cascades (in time and space) that would be necessary to measure a change in the shape of the current waveform of the transmitted ion beam. We discuss the concept of pump-probe type experiments with short ion beam pulses to access defect dynamics in materials and outline a path to increasing damage rates with heavier ions and by the application of longitudinal and lateral pulse compression techniques.

Keywords

radiation effectsion-implantationdefects
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1712: Symposium ZZ – Recent Advances in the Structural Characterization of Materials , 2014 , mrss14-1712-zz01-02
Copyright
Copyright © Materials Research Society 2014 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Diaz de la Rubia, T., et al. ., Nature 406, 871 (2000).CrossRefGoogle Scholar
Victoria, M. et al. ., J. Nucl. Mater. 276, 114 (2000).CrossRefGoogle Scholar
Stuchbery, A. E. and Bezakova, E., Phys. Rev. Lett. 82, 18 (1999).CrossRefGoogle Scholar
Myers, M. T., Charnvanichborikarn, S., Shao, L., Kucheyev, S. O., Phys. Rev. Lett. 109, 095502, (2012).CrossRefGoogle Scholar
Friedman, A., et al. ., Phys. Plasmas 17, 056704 (2010).CrossRefGoogle Scholar
Waldron, W. L., et al. ., Nucl. Instr. Meth. A, 733, 226–232 (2014), doi: 10.1016/j.nima.2013.05.063.CrossRefGoogle Scholar
Schenkel, T., et al. ., Nucl. Instr. Meth. B 315, 350 (2013).CrossRefGoogle Scholar
SIMS analysis was provided by Evans Analytical, http://www.eag.com/ Google Scholar
Feldman, Leonard C., Mayer, James W. and Picraux, Steward T.A., Materials Analysis by Ion Channeling, (Academic Press, 1982), pp.41.Google Scholar
Barnard, J., et al. ., in preparation.Google Scholar
Zinkle, S. J., Fusion Science and Tech. 64, 65 (2013); Zinkle, S. J. and Was, G. S. , Acta Materialia 61, 735(2013).CrossRefGoogle Scholar