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Dynamic Behaviour of Lead Nanoparticles in A Dielectric Matrix

Published online by Cambridge University Press:  21 February 2011

P. Cheyssac
Affiliation:
Laboratoire de Physique de la Matière Condensée, URA 190, Université de Nice Sophia Antipolis, 06108 Nice Cedex 2, France
R. Kofman
Affiliation:
Laboratoire de Physique de la Matière Condensée, URA 190, Université de Nice Sophia Antipolis, 06108 Nice Cedex 2, France
P. G. Merli
Affiliation:
Istituto di Chimica e Tecnologie dei Materiali e dei Componenti dell′ Elettronica del Consiglio Nazionale delle Ricerche, Via di Castagnoli 1, I- 40126 Bologna, Italy
A. Migliori
Affiliation:
Istituto di Chimica e Tecnologie dei Materiali e dei Componenti dell′ Elettronica del Consiglio Nazionale delle Ricerche, Via di Castagnoli 1, I- 40126 Bologna, Italy
A. Stella
Affiliation:
Dipartimento di Fisica A. Volta, Università degli Studi di Pavia, Via A. Bassi 6, 27100 Pavia, Italy
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Abstract

In this paper we present electron microscopy results near and below the melting temperature, both in dark field and high resolution mode, of lead nanoparticles embedded in a dielectric matrix of amorphous SiOx. Three different size dependent regimes are distinguished. Indications of solid particles rotations as well as of a new phenomenon amenable to spontaneous solid-liquid phase fluctuations will be briefly discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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References

1 - Buffat, Ph. and Borel, J.P., Phys. Rev. 13, 2287 (1976)Google Scholar
2 - Lereah, Y., Deutscher, G., Cheyssac, P. and Kofman, R., Europhysics Letters 12, 709 (1990)Google Scholar
3 - Ercolessi, F., Andreoni, W. and Tosatti, E., Phys. Rev. Letters 66, 911, (1991)Google Scholar
4 - Chen, X.J., Levi, A.C. and Tosatti, E., II Nuovo Cimento 13D (1991) 919 CrossRefGoogle Scholar
5 - Kofman, R., Cheyssac, P., Aouaj, A., Lereah, Y., Deutscher, G., Ben-David, T., Pénisson, J.M. and Bourret, A., Surf. Sci. in pressGoogle Scholar
6 - Dash, J.G., Contemporary Physics, 30, 89, (1989)Google Scholar
7 - Frenken, J.W.M., Maree, P.M.J. and Veen, J.F. Van der, Phys. Rev. B 34, 7506, (1986)Google Scholar
8 - Gladkikh, N.I., Chizhik, S.P., Larin, V.L., Grigoreva, L.K. and Sukhov, V.N., Izv. Acad. Nauk SSSR Met. 5, 196, (1982)Google Scholar
9 - Garrigos, R., Cheyssac, P. and Kofman, R., Z. Phys. D 12,497 (1989)Google Scholar
10 - The reflectivity rise at the transition temperature is generally considered a very reliable indicator of the solid to liquid transition. (See Auston, D.H. et al, in Appl. Phys. Lett. 34, 365, (1978)).Google Scholar
11 - Beaglehole, D, J. of Crystal Growth, 112, 663, (1991)Google Scholar
12 - Broughton, J.Q. and Gilmer, G.H., Acta Metall. 31, 854, (1983)Google Scholar
13 - The calculation was performed under the assumption of spherical particles (as confirmed by DF and HREM data) and of a relatively not too strong perturbation at RT due to the presence of the matrix instead of the vapour. It was checked in any case that variations up to 8% in the free energies due to such perturbation do not change the main features of the curves in fig 6.Google Scholar