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Doping of Al-catalyzed Vapor-liquid-solid Grown Si Nnanowires

Published online by Cambridge University Press:  01 February 2011

Sung Jin Whang
Affiliation:
[email protected], National University of Singapore, Electrical and Computer Engineering, Block E4A #02-04 Engineering Drive 3, Singapore, Singapore, 117576, Singapore
Sung Joo Lee
Affiliation:
[email protected], National University of Singapore, Electrical and Computer Engineering, Block E4A #02-04 Engineering Drive 3, Singapore, Singapore, 117576, Singapore
Wei Feng Yang
Affiliation:
[email protected], National University of Singapore, Electrical and Computer Engineering, Block E4A #02-04 Engineering Drive 3, Singapore, Singapore, 117576, Singapore
Hai Chen Zhu
Affiliation:
[email protected], National University of Singapore, Electrical and Computer Engineering, Block E4A #02-04 Engineering Drive 3, Singapore, Singapore, 117576, Singapore
Han Lu Gu
Affiliation:
[email protected], National University of Singapore, Electrical and Computer Engineering, Block E4A #02-04 Engineering Drive 3, Singapore, Singapore, 117576, Singapore
Byung Jin Cho
Affiliation:
[email protected], National University of Singapore, Electrical and Computer Engineering, Block E4A #02-04 Engineering Drive 3, Singapore, Singapore, 117576, Singapore
Yun Fook Liew
Affiliation:
[email protected], National University of Singapore, Electrical and Computer Engineering, Block E4A #02-04 Engineering Drive 3, Singapore, Singapore, 117576, Singapore
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Abstract

We successfully synthesized high quality single crystal Si nanowires using Al catalyst via vapor-liquid-solid (VLS) mechanism, having diameters ranging from 10 to 200 nm with 10∽20 §­ of length. Characterization of physical and chemical properties of Al-catalyzed Si nanowires using transmission electron microscope (TEM), scanning electron microscope (SEM), X-ray photoelectron spectroscopy (XPS) analysis showed that single crystal Si nanowires can be grown with Al-catalyst at 540 ¡C and selective etching of Al existing at the tip of nanowire can provide metal-free Si nanowires that are compatible with conventional Si-based IC process. By using plasma doping method, it was confirmed that the doping level can be controlled and the boron was successfully introduced on Si substrate with 3×1022/cm3 of peak doping concentration.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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