Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-29T07:42:04.936Z Has data issue: false hasContentIssue false
  • English
  • Français

Diffraction of Fe/Cr using Anomalous Dispersion Enhancement

Published online by Cambridge University Press:  15 February 2011

C. L. Foiles ,
R. Loloee  and
Sharif M. Rahman
C. L. Foiles
Affiliation:
Dept. of Physics and Astronomy, Michigan State University, East Lansing, MI 48824-1116
R. Loloee
Affiliation:
Dept. of Physics and Astronomy, Michigan State University, East Lansing, MI 48824-1116
Get access

Abstract

Results for a study using anomalous scattering to increase the X-ray contrast between Fe and Cr in metallic multilayers are reported. This increased contrast is sufficient to provide reliable values for actual bilayer distances and to begin semi-quantitative analysis of peak intensities even in the presence of orientational texture.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 307: Symposium L – Applications of Synchrotron Radiation Techniques to Materials Science , 1993 , 305
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Baibich, M.W., Broto, J.M., Fert, A., Nguyen, F. Van Dau, Petroff, F., Etinne, P., Creuzet, G., Friederich, A. and Chazelas, J., Phys. Rev. Lett. 61, 2472 (1988).Google Scholar
2. Binasch, G., Grunberg, P., Saurenbach, F. and Zinn, W., Phys. Rev. B39, 482 (1989).Google Scholar
3. Fullerton, E.E., Kelly, D.M., Guimpel, J., Schuller, I.K. and Bruynseraede, Y., Phys. Rev. Lett. 68, 859 (1992).CrossRefGoogle Scholar
4. Toyoda, Tetsuya and Natsume, Yuhei, J. Phys. Soc. Japan 61, 1173 (1992).Google Scholar
5. Fullerton, Eric E., Schuller, Ivan K., Vanderstraeten, H. and Bruynseraede, Y., Phys. Rev. B 45, 9292 (1992) and reference therein cited.Google Scholar
6. Slaughter, J.M., Pratt, W.P. Jr. and Schroeder, P.A., Rev. Sci. Instrum. 60, 127 (1989).CrossRefGoogle Scholar
7. Foiles, C.L., Sung, H-K., Loloee, R. and Shull, V., Bull. APS 37, 404 (1992).Google Scholar
8. Sung, H-K. and Foiles, C.L., Philoso. Mag. B65, 1235 (1992).Google Scholar
9. Foiles, C.L., Rahman, SharifM. and Loloee, R., manuscript in preparation (1993).Google Scholar
10. Miceli, P.F., Neumann, D.A. and Zabel, H., Appl. Phys. Lett. 48, 24 (1986).Google Scholar
11. Values calculated by David Cox, NSLS, using the program GSAS supplied by Allen Larson, C. and Dreele, Robert B. Von [Los Alamos National Laboratory, LAUR 86–748].Google Scholar