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Diffraction Microscopy using 20-kV Electron Beam for Multi-Wall Carbon Nanotubes

Published online by Cambridge University Press:  01 February 2011

Osamu Kamimura
Affiliation:
[email protected], Central Research Laboratory, Hitachi, Ltd., Advanced Technology Research Dept., 1-280, Higashi-koigakubo, Kokubunji-shi, Tokyo, N/A, Japan
Kota Kawahara
Affiliation:
[email protected], Hokkaido University, Department of Applied Physics, Sapporo, N/A, Japan
Takahisa Doi
Affiliation:
[email protected], Central Research Laboratory, Hitachi, Ltd., 1-280, Higashi-koigakubo, Kokubunji-shi, Tokyo, N/A, Japan
Takashi Dobashi
Affiliation:
[email protected], Central Research Laboratory, Hitachi, Ltd., 1-280, Higashi-koigakubo, Kokubunji-shi, Tokyo, N/A, Japan
Takashi Abe
Affiliation:
[email protected], Hokkaido University, Department of Applied Physics, Sapporo, N/A, Japan
Kazutoshi Gohara
Affiliation:
[email protected], Hokkaido University, Department of Applied Physics, Sapporo, N/A, Japan
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Abstract

Diffraction microscopy (or diffractive imaging) with iterative phase retrieval was performed using a low-energy (20-keV) electron beam to verify the possibility of high-resolution imaging with low specimen damage. Diffraction patterns of fine and uniform multi-wall carbon nanotubes (MWCNT) were recorded without a post-specimen lens. One- and two-dimensional phase retrievals were processed from the diffraction pattern alone. The reconstructed object images reflected the characteristic structure of the MWCNT. These results show the possibility of high-resolution imaging with a low-energy electron beam.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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