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Differential Hysteresigraph using the Transverse Magneto-Optic Kerr Effect Applied to Thin Magnetic Films

Published online by Cambridge University Press:  21 February 2011

Y. Souche ,
J. M. Alameda ,
O. Cugat ,
D. Givord ,
A. Lienard  and
J. M. Ndjaka
Y. Souche
Affiliation:
Laboratoire Louis Néel, C.N.R.S., 166 X, 38042 GRENOBLE cedex, France
J. M. Alameda
Affiliation:
Dpto de Fisica, Universidad de Oviedo, OVIEDO, Spain
O. Cugat
Affiliation:
Laboratoire Louis Néel, C.N.R.S., 166 X, 38042 GRENOBLE cedex, France
D. Givord
Affiliation:
Laboratoire Louis Néel, C.N.R.S., 166 X, 38042 GRENOBLE cedex, France
A. Lienard
Affiliation:
Laboratoire Louis Néel, C.N.R.S., 166 X, 38042 GRENOBLE cedex, France
J. M. Ndjaka
Affiliation:
Laboratoire Louis Néel, C.N.R.S., 166 X, 38042 GRENOBLE cedex, France
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Abstract

A simple differential set up for measuring changes in reflectivity of a flat surface of a ferromagnetic material, the so-called transverse magneto-optic Kerr effect, is described. The differential procedure is used with the aim of minimizing mechanical and optical noise.

Hysteresis cycles have been plotted for several ferromagnetic films of sputtered amorphous R-M alloys (R - Y, La; M - Co, Ni) and reveal good proportionality between ΔR/R, the relative change of reflectivity, and the magnetization measured with a SQUID magnetometer.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 150: Symposium F – Materials for Magneto-Optic Data Storage , 1989 , 165
Copyright
Copyright © Materials Research Society 1989

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References

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