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Dewetting of A Complex Polymer: Perfluoro-Ionomer

Published online by Cambridge University Press:  17 March 2011

Teresa A. Hill ,
Xuesong Jiao ,
Charles W. Martin  and
Dvora Perahia
Teresa A. Hill
Affiliation:
Chemsitry Department, Clemson University, Clemson, SC 29634, U.S.A.
Xuesong Jiao
Affiliation:
Chemsitry Department, Clemson University, Clemson, SC 29634, U.S.A. Materials Science and Engineering, Clemson University, Clemson, SC 29634, U.S.A
Charles W. Martin
Affiliation:
Chemsitry Department, Clemson University, Clemson, SC 29634, U.S.A. Currently at Gore and Associates, Newark, DE
Dvora Perahia*
Affiliation:
Chemsitry Department, Clemson University, Clemson, SC 29634, U.S.A. Materials Science and Engineering, Clemson University, Clemson, SC 29634, U.S.A
*
Author for correspondence
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Abstract

The stability and interfacial structure of ultra thin films of perfluoro-ion containing polymers (ionomers) have been studied using atomic force microscopy and neutron reflectometry. These complex polymers have significant technological applications from thin coatings, to fuel cells as polymer electrolyte membranes, to protective clothing. In particular we focused on the study of [(CF2CF2)n (CF2CFR)]m where R= [OCF2CF2SO3 (X)] and X=H, (800 equivalent weight), coated on silicon oxide. Neutron Reflectometry has shown that film consists of three distinct regions: a region of high density at the interface with the silicon oxide, an intermediate layer with constant density and an air-interface layer where the density decreases due to interfacial roughness. In contrast to noionic polymers, the films proven stable as a function of annealing time above the bulk glass transition, i.e the films do not dewet. This stability is attributed to electrostatic interactions.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 710: Symposia DD – Polymer Interfaces and Thin Films , 2001 , DD13.9.1
Copyright
Copyright © Materials Research Society 2002

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References

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