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Development of a Biaxial Tensile Module at Synchrotron Beamline for the Study of Mechanical Properties of Nanostructured Films

Published online by Cambridge University Press:  31 January 2011

Eric Le Bourhis ,
Baptiste Girault ,
Pierre-Olivier Renault ,
Philippe Goudeau ,
Guillaume Geandier ,
Dominique Thiaudière ,
Rado N Randriamazaoro ,
Rémy Chiron ,
Damien Faurie  and
Olivier Castelnau
Eric Le Bourhis
Affiliation:
[email protected], U. Poitiers, LPM-CNRS UMR 6630, Futuroscope-chasseneuil, France
Baptiste Girault
Affiliation:
[email protected], U. Poitiers, LPM-CNRS UMR 6630, Futuroscope-chasseneuil, France
Pierre-Olivier Renault
Affiliation:
[email protected], U. Poitiers, LPM-CNRS UMR 6630, Futuroscope-chasseneuil, France
Philippe Goudeau
Affiliation:
[email protected], U. Poitiers, LPM-CNRS UMR 6630, Futuroscope-chasseneuil, France
Guillaume Geandier
Affiliation:
[email protected], Synchrotron SOLEIL, DIFFABS, Gif sur Yvette, France
Dominique Thiaudière
Affiliation:
[email protected], Synchrotron SOLEIL, DIFFABS, Gif sur Yvette, France
Rado N Randriamazaoro
Affiliation:
[email protected], U. Paris-Nord, LPMTM-CNRS UPR 9001, Villetaneuse, France
Rémy Chiron
Affiliation:
[email protected], U. Paris-Nord, LPMTM-CNRS UPR 9001, Villetaneuse, France
Damien Faurie
Affiliation:
[email protected], U. Paris-Nord, LPMTM-CNRS UPR 9001, Villetaneuse, France
Olivier Castelnau
Affiliation:
[email protected], U. Paris-Nord, LPMTM-CNRS UPR 9001, Villetaneuse, France
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Abstract

We have developed on the DIFFABS-SOLEIL beamline a biaxial tensile machine with synchrotron standard for in-situ diffraction characterization of thin polycrystalline metallic film mechanical response. The machine has been designed to test cruciform substrates coated by the studied film under controlled applied strain field. Technological challenges comprise the fixation of the substrate, the generation of a uniform strain field in the studied (central) volume, the operations from the beamline pilot. Tests on W and W/Cu multilayers films deposited on polyimide substrates are presented.

Keywords

x-ray diffraction (XRD)thin filmstrength
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1224: Symposia FF/GG – Mechanical Behavior at Small Scales — Experiments and Modeling , 2009 , 1224-GG03-08
Copyright
Copyright © Materials Research Society 2010

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References

1 Meyers, M.A., Mishra, A., Benson, D.J., Prog. Mater. Sci. 51 (2006) 427.Google Scholar
2 Böhm, J., Gruber, P., Spolenak, R., Stierle, A., Wanner, A., Arzt, E., Rev. Sci. Inst. 75 (2004) 1110.Google Scholar
3 Faurie, D., Renault, P.-O., Bourhis, E. Le, Villain, P., Goudeau, Ph., and Badawi, K. F., Thin Solid Films, 469–470 (2004) 201.Google Scholar
4 Hannon, A., and Tiernan, P., J. Mater. Proc. Techn. 198, 1 (2008).Google Scholar
5 Demmerle, S., Boehler, J.P., J. Mech. Phys. Solids 41, 143 (1993)Google Scholar
6 Renault, P.O., Badawi, K.F., Bimbault, L., Goudeau, P., Elkaïm, E., Lauriat, J.P., Appl. Phys. Lett. 73 (1998) 1953 Google Scholar
7 Hauk, V. (1997), Structural and residual stress analysis by non destructive methods: Evaluation, application, assessment. Elsevier Science, Amsterdam.Google Scholar
8 Noyan, I.C., Cohen, J.B. (1987) Residual stresses. Measurements by diffraction and interpretation, Springer Verlag, New York.Google Scholar
9 Matthies, S., Priesmeyer, H. G., Daymond, M. R., J. Appl. Cryst. 34, 585 (2001).Google Scholar
10 Faurie, D., Castelnau, O., Brenner, R., Renault, P.-O., Bourhis, E. Le, Goudeau, Ph., J. Appl. Cryst. 42 (2009) doi:10.1107/S0021889809037376.Google Scholar
11 Bourhis, E. Le (2008), Glass mechanics and technology, Wiley, Weinheim.Google Scholar