Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-03T02:27:11.004Z Has data issue: false hasContentIssue false

Determination of the Fracture Toughness of the Niobium/Sapphire Interface

Published online by Cambridge University Press:  10 February 2011

H. JI
Affiliation:
Physics Department
G. S. WAS
Affiliation:
Department of Materials Science & Engineering Department of Nuclear Engineering & Radiological Sciences
M. D. Thouless
Affiliation:
Department of Mechanical Engineering and Applied Mechanics all at the University of Michigan, Ann Arbor, MI 48109
Get access

Abstract

In this work, the effect of composition and crystal orientation relationship on theinterface fracture toughness of niobium/sapphire system was studied. Interfaces were synthesized by either physical vapor deposition or ion beam assisted deposition. Silver was deposited to weaken the interface and crystal orientation was used to strengthen it. Several techniques were used to assess the interface fracture toughness, including microscratch, nanoindentation, microwedge scratch, and delamination of patterned lines. Results showed a general trend in which the interface fracture toughness decreased with the amount of silver. Ion bombardment during film deposition significantly increased the interface fracture toughness through a combination of interface mixing and a controlled orientation relationship.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Jokl, M. L., Vitek, V., and McMahon, C. J., Acta Metallurgica, 1980, vol.28, 1479.Google Scholar
2. Ji, H., Was, G. S., Jones, J. W., and Moody, N. R., Mat. Res. Soc. Symp. Proc., 1997, Vol.458, p191 .Google Scholar
3. Elssner, G., Korn, D., and M Rühle, Scripta Metallurgica et Materialia, 1994, vol.31, no. 8, pp10371042.Google Scholar
4. Seah, M. P., Acta Metall., 1980, 28, 955.Google Scholar
5. Rice, J. R., Suo, Z., and Wang, J. S., in: Metal-Ceramic Interfaces (Riuhle, M., Ashby, M. F., Evans, A. G., and Hirth, J. P., ed.), Pergamon Press, Oxford, 1989.Google Scholar
6. Ji, H., Was, G. S., Jones, J. W., and Moody, N. R., J. Appl. Phys., 1997, Vol.81, issue 10, pp 67546761.Google Scholar
7. Venkataraman, S., Kohlstedt, D. L., and Gerberich, W. W., J. Mater. Res., 1992, Vol. 7, No. 5, p1126.Google Scholar
8. Evans, A. G. and Hutchinson, J. W., Int. J. Solids Struct., 1984, 20, 455.Google Scholar
9. de Boer, M. P., Kriese, M., and Gerberich, W. W., J. Mater. Res., 1997, Vol.12, No. 10, 2673.Google Scholar
10. Elssner, G., Suga, T., and Turwitt, M., J. Phys. (Orsay), 1985, 46-C4, 597.Google Scholar
11. Korn, D., Elssner, G., Fischmeister, H. F., and Rühle, M., Acta. metall. mater., 1992, vol 40, suppl., pp. S355–S360.Google Scholar
12. Nicholas, M.G., in: Surfaces and Interfaces of Ceramic Materials', (ed. Dufour, L.-C. et al.),393; Norwell, MA, Kluwer Academic, 1989.Google Scholar
13. de Boer, M. P., Huang, H., and Gerberich, W. W., Mat. Res. Soc. Symp. Proc, 1995, Vol. 356, p. 821.Google Scholar
14. Hutchinson, J. W. and Suo, Z., Advances in Applied Mechanics, 1992, vol.29, p 63.Google Scholar
15. Ji, H., Was, G. S., Jones, J. W., and Moody, N. R., Mat. Res. Soc. Symp. Proc., 1996, Vol.434, p153.Google Scholar
16. Hu, S., Thouless, M. D., and Evans, A. G., Acta, Metall, 1988, vol.36, no. 5, p 13011307.Google Scholar
17. Baglin, J. E. E., in: Ion beam modification of insulators, (ed. Mazzoldi, P. and Arnold, G. W.), Chap. 15, 585, Amsterdam, Elsevier, 1986.Google Scholar
18. Ji, H., doctorate dissertation, University of Michigan, Ann Arbor, 1998.Google Scholar