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Detection of SUB-PPM Impurity Levels by Selectively Excited Photoluminescence in Fluoride Glass Optical Fibers

Published online by Cambridge University Press:  25 February 2011

W. J. Miniscalco  and
B. A. Thompson
W. J. Miniscalco
Affiliation:
GTE Laboratories Incorporated, 40 Sylvan Road, Waltham, MA 02254
B. A. Thompson
Affiliation:
GTE Laboratories Incorporated, 40 Sylvan Road, Waltham, MA 02254
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Abstract

A technique is presented which addresses the problem of analyzing impurities in heavy metal fluoride glass optical fibers at the extremely low levels required for long distance applications. The procedure uses selectively excited fiber impurity luminescence (SEFIL), and is extremely sensitive due to the zero-background nature of luminescence and the long interaction lengths afforded by optical fiber. The technique has been rendered quantitative through the use of standards and the normalization of the impurity emission by the Raman scattering intensity. A SEFIL analysis of two fibers with differing origins and designs is reported. The ultimate detection limits are estimated to be <1 ppb-wt for Fe3+ and ≤ 0.001 ppb-wt for Nd3+ and Pr3+.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 88: Symposium P – Optical Fiber Materials and Properties , 1986 , 127
Copyright
Copyright © Materials Research Society 1987

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References

REFERENCES

1. Ohishi, Y.. Mitachi, S., Kanamori, T., and Manabe, T., Phys. Chem. Glasses 24, 135 (1983).Google Scholar
2. France, P. W., Carter, S. F. and Parker, J. M., Phys. Chem. Glasses 27, 32 (1986).Google Scholar
3. Mitachi, S., Terunuma, Y., Ohishi, Y. and Takahashi, S., Jpn. J. Appl. Phys. 22, L537 (1983).Google Scholar
4. Ghosh, G., Kachi, S., Nakamura, K. and Kimura, M., Jpn. J. Appl. Phys. 25, L376 (1986).Google Scholar
5. Lucas, J., Chanthanasinh, M., Poulain, M. and Poulain, M., J. Non-Cryst. Sol. 27, 273 (1978).Google Scholar
6. Sakaguchi, S., Kanamori, T., Terunuma, Y., Ohishi, Y. and Takahashi, S., Jpn. J. Appl. Phys. 25, L481 (1986).Google Scholar
7. Miniscalco, W. J. and Thompson, B. A., Elect. Lett., in press.Google Scholar
8. Adam, J. L. and Sibley, W. A., J. Non-Cryst. Solids 76, 267 (1985).Google Scholar
9. Freitas, J. A., Strom, U. and Tran, D. C., Mat. Sci. Forum 6, 627 (1985).Google Scholar
10. Miniscalco, W. J., Andrews, L. J. and Thompson, B. A., Bull. Am. Phys. Soc. 31, 639 (1986).Google Scholar
11. Fisher, C. F. (private communication).Google Scholar