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Depth-Dependent Hardness Characterization by Nanoindentation using a Berkovich Indenter with a Rounded Tip

Published online by Cambridge University Press:  01 February 2011

Ju-Young Kim ,
David T. Read  and
Dongil Kwon
Ju-Young Kim
Affiliation:
School of Materials Science and Engineering, Seoul National University, Seoul 151-744, South Korea
David T. Read
Affiliation:
Materials Reliability Division, National Institute of Standards and Technology, Boulder, CO 80305, USA
Dongil Kwon
Affiliation:
School of Materials Science and Engineering, Seoul National University, Seoul 151-744, South Korea
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Abstract

The height difference Δhb between the ideally sharp Berkovich indenter tip and a Δhb rounded tip was measured by direct observation using atomic force microscopy (AFM). The accuracy of the indirect area function method for measuring h was confirmed. The Δhb indentation size effects (ISE) in (100) single crystal copper, (100) single crystal tungsten, and fused quartz were characterized by applying the ISE model considering the rounded tip effect. The model fits the data these materials well, even though fused quartz does not deform by dislocations. However, a very small value of the ISE characteristic length h' was obtained for fused quartz. The present h' value for (100) copper is 32% larger than a previously-measured value for polycrystalline copper. This may indicate that grain boundaries suppress the dislocation activity envisioned in the ISE model.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 875: Symposium O – Thin Films - Stresses and Mechanical Properties XI , 2005 , O2.4
Copyright
Copyright © Materials Research Society 2005

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References

1. Oliver, W.C. and Pharr, G.M., J. Mater. Res. 7, 1564 (1992).Google Scholar
2. Lee, Y.-H. and Kwon, D., J. Mater. Res. 17, 901 (2002).Google Scholar
3. Ma, Q. and Clarke, D.R., J. Mater. Res. 10, 853 (1995).Google Scholar
4. McElhaney, K.W., Vlassak, J.J., and Nix, W.D., J. Mater. Res. 13, 1300 (1998).Google Scholar
5. Nix, W.D. and Gao, H., J. Mech. Phys. Sol. 46, 411 (1998).Google Scholar
6. Wei, Y., Wang, X., and Zhao, M., J. Mater. Res. 19, 208 (2004).Google Scholar
7. Kim, J.-Y., Lee, B.-W., Read, D.T., and Kwon, D., Scripta Mater. 52, 353 (2005).Google Scholar
8. Lee, Y.-H. and Kwon, D., Kor, J.. Inst. Met. & Mater. 41, 104 (2003).Google Scholar
9. Callister, W.D. Jr, Materials Science and Engineering: An Introduction, 3rd ed. (John Wiley & Sons, Inc., New York, 1994), p. 111.Google Scholar