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Deposition, Characterization, and Magneto-Optical Properties of Amorphous TbFe Alloys

Published online by Cambridge University Press:  26 February 2011

D. Chakravartty ,
M. Mansuripur  and
M. F. Ruane
D. Chakravartty
Affiliation:
Boston University, College of Engineering, Boston, MA 02215
M. Mansuripur
Affiliation:
Boston University, College of Engineering, Boston, MA 02215
M. F. Ruane
Affiliation:
Boston University, College of Engineering, Boston, MA 02215
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Abstract

Amorphous films of TbxFe1-x are prepared by simultaneous RF bias sputtering onto various substrates and the hysteresis loops of the resulting samples are obtained both by magneto-optical and VSM loop tracers. The coercivities of the samples deposited in the same run but onto different substrates are observed to be somewhat different and these differences are discussed in light of the current understanding of the deposition process.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 80: Symposium G – Science and Technology of Rapidly Quenched Alloys , 1986 , 429
Copyright
Copyright © Materials Research Society 1987

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References

1) Chaudhari, P.. Cuomo, J., Gambino, R., Appl. Phys. Lett. 22, 337 (1973).Google Scholar
2) Mimura, Y., Imamura, N., Kobayashi, T., Okada, A., Kushiro, Y., J. Appl. Phys., 49, 1208 (1978).CrossRefGoogle Scholar
3) Kryder, M., Meikiejohn, W., Skoda, R., Proc. Soc. Photo Instrum. Eng. (SPIE. 420, 236 (1983).Google Scholar
4) Mansuripur, M., Connell, G.A.N., Goodman, J. W., J. Appl. Phys., 53, 4485 (1982).Google Scholar
5) Luborsky, F., Furey, J., Skoda, R., Wagner, B., Proc. Soc. Photo Instrum. Eng. (SPIE) 529, 55 (1985).Google Scholar
6) Shieh, H., Kryder, M., Appl. Phys. Lett., 49, 473 (1976).Google Scholar