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Dependence on MOCVD Growth Temperature of The Photoluminescence Properties of ZnSe, ZnTe, and ZnSe(1-x)Te(x) Alloys and ZnSe/ZnTe Superlattices

Published online by Cambridge University Press:  25 February 2011

B.E. Ponga
Affiliation:
Grotpe d'Etudes des Semicondicteurs, Universiti de Montpellier II, Case Courrier 074, Place Eugene Bataillon, 34095 Montpellier CEDEX 05, FRANCE
J. Calas
Affiliation:
Grotpe d'Etudes des Semicondicteurs, Universiti de Montpellier II, Case Courrier 074, Place Eugene Bataillon, 34095 Montpellier CEDEX 05, FRANCE
M. Averous
Affiliation:
Grotpe d'Etudes des Semicondicteurs, Universiti de Montpellier II, Case Courrier 074, Place Eugene Bataillon, 34095 Montpellier CEDEX 05, FRANCE
T. Cloitre
Affiliation:
Grotpe d'Etudes des Semicondicteurs, Universiti de Montpellier II, Case Courrier 074, Place Eugene Bataillon, 34095 Montpellier CEDEX 05, FRANCE
O. Briot
Affiliation:
Grotpe d'Etudes des Semicondicteurs, Universiti de Montpellier II, Case Courrier 074, Place Eugene Bataillon, 34095 Montpellier CEDEX 05, FRANCE
B. Gil
Affiliation:
Grotpe d'Etudes des Semicondicteurs, Universiti de Montpellier II, Case Courrier 074, Place Eugene Bataillon, 34095 Montpellier CEDEX 05, FRANCE
R.L. Aulombard
Affiliation:
Grotpe d'Etudes des Semicondicteurs, Universiti de Montpellier II, Case Courrier 074, Place Eugene Bataillon, 34095 Montpellier CEDEX 05, FRANCE
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Abstract

It has been recently shown that high quality ZnSe and ZnTc filns can be grown on GaAs using low temperature growth techniques such as Metal-Organic Chemical Vapor Deposition ( MOCVD). All samples: ZnSe, ZnTe, ZnSc(l−x)Tc(x) epilayers and ZnSe/ZnTc superlattices were grown using a novel zinc precursor, the Tri-Ethyl-Amine Di-Methyl-Zinc, while we used the classical precursors H2Se and Di-Isopropyl-Tellurium for selenium and tellurium. Investigation of the photoluminescence (PL) properties of ZnSc and ZnTe single layers enabled us to optimize the growth conditions of these compounds. The crystal growth conditions for mixed alloys and superlattices were determined by direct comparison to the aspect of low-temperature PL features. Strong PL spectra were obtained from these materials, suggesting us that tellurium has the ability to behave like an iso-clectronic center. At low concentration of tellurium in ZnSe, an interesting physical situation is observed, which we have interpreted in terms of extrinsic exciton “self-trapping” mechanism.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

[1]. Magita, M., Taike, A., and Yamamoto, H., J. Appl. Phys. 68, 880 (1990).Google Scholar
[21. Haase, M., Qiu, j., Puydt, J De, and Cheng, H., Appl. Phys. Lett. 59, 1272 (1991)Google Scholar
[31. Cheng, H., Dcpuydt, J. M., Potts, J. E., and Smith, T. L., Appl. Phys. Lctt 52, 174 (1988).Google Scholar
[4]. Permogorov, S., Reznitsky, A., Verbin, S., Nauinov, A., Osten, W. Von der, and Stolz, H., J. Phys (Paris), C7, 173 (1985).Google Scholar
[5]. Lee, D., Mysyrowicz, A., Nurmikko, A. V., and Fitzpatrick, B. F., Phys. Rev. Lctt. 58, 1475 (1987).Google Scholar
[6]. Toyozawa, Y., Physica 117B, 118B, 23 (1983).Google Scholar
[7]. Goede, O., and Heimbradt, W., Phys. Stat. Solidi. B 110, 175, (1982).Google Scholar
[8]. Wrigth, P.J., Cockayne, B., Parbrook, P.J., Olivier, P.E., Jones, A.C., J. Crystal. Growth. 108, 525 (1991).Google Scholar
[9]. Gutowski, J., Presser, N., and Kudlek, G., Phys. Stat. Solidi. A 120, 11, (1990).Google Scholar
[10]. Kuhn, W., Wagner, H.P., Stanzl, H., Wolf, K., Worle, K., Lankes, S., Betz, J., Worz, M., Lichtenberg, D., Leiderer, H., Gebhardt, W. and Triboulet, R., Semicond. Sci. Technol. 6, A105 (1991).Google Scholar
[11]. Brasil, M.J.P., Nahory, R.E., Turco-Sandroff, F.S., Gilchrist, H.L., and Martin, R.L., Appl. Phys. Lett. 58 (22), 2509 (1991).Google Scholar
[12]. Lee, C.D., Park, H.L., Chung, C.H., and Chang, S.K., Phys. Rev. B 45, 4491 (1992).Google Scholar
[13]. Einevoll, G.T., Citrin, D.S. and Chang, Y.C., Phys. Rev. B 44, 8068 (1991).Google Scholar
[14]. Davies, J.J., Semicond. Sci. Technol. 3, 219 (1988).Google Scholar
[15]. Nurmikko, A.V., Kolodziejski, L.A., and Gunshor, R.L., J. Cryst. Growth. 95, 589 (1989).Google Scholar
[16]. More, K. J., Inst. Phys. Conf. Ser. 123, 187 (1992).Google Scholar