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Deformation of Small Volumes of Material Studied Using Strained-Layer Superlattice Structures

Published online by Cambridge University Press:  10 February 2011

K.M.Y. P'ng ,
A.J. Bushby  and
D.J. Dunstan
K.M.Y. P'ng
Affiliation:
Department of Materials, Queen Mary, University of London, E1 4NS, UK.
A.J. Bushby
Affiliation:
Department of Materials, Queen Mary, University of London, E1 4NS, UK.
D.J. Dunstan
Affiliation:
Department of Physics, Queen Mary, University of London, E1 4NS, UK.
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Abstract

Mechanical studies of semiconductor superlattices have shown that the onset of plastic deformation under an inhomogeneous stress is a process that takes place simultaneously across a finite volume of the order of a micron across. The ability to incorporate known internal stresses, and to vary the stress and thickness of individual layers in a semiconductor superlattice, is a very powerful tool, opening up new possibilities for investigations that cannot be achieved by varying external stresses on a specimen that is sensibly homogeneous. In this way, from the initial yield stress of single-crystal strained-layer superlattices under indentation, we demonstrated a new criterion, of which the key feature is that it is to be averaged over a finite volume. Here we show that designing samples with individual layers in bands to form low yield-stress material within the structure can give information about the size and position of the initial yield volume.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 778: Symposium U – Mechanical Properties Derived from Nanostructuring Materials , 2003 , U6.3
Copyright
Copyright © Materials Research Society 2002

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References

1. Jayaweera, N.B., Bushby, A.J., Kidd, P., Kelly, A. and Dunstan, D.J., Phil. Mag. Lett. 79, 343 (1999).Google Scholar
2. Jayaweera, N.B., Downes, J.R., Frogley, M.D., Hopkinson, M., Bushby, A.J., Kidd, P., A. Kelly and Dunstan, D.J., D.J., Proc. Roy. Soc. A (2003) (in press).Google Scholar
3. Bushby, A.J., Downes, J.R., Jayaweera, N.B., Kidd, P., Kelly, A. and Dunstan, D.J., Mater. Res. Soc. Symp. Proc. 649, Q8.4. (2001).Google Scholar
4. Lloyd, S.J., P'ng, K.M.Y. Bushby, A.J., Dunstan, D.J. and Clegg, W.J., Yield of InxGa1-xAs superlattices under bending and nanoindentation, this volume.Google Scholar
5. Jayaweera, N.B., Downes, J.R., Dunstan, D.J., Bushby, A.J., Kidd, P. and Kelly, A., MRS Symp. Proc. 634, B4.10 (2001).Google Scholar
6. Bushby, A.J. and Dunstan, D.J., Plasticity size effects at small length scales, Thin Solid Films (2003) (submitted).Google Scholar