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Deformation Mechanisms of a Micro-Sized Austenitic Stainless Steel with Fine Grains

Published online by Cambridge University Press:  17 March 2011

G. P. Zhang ,
K. Takashima ,
M. Shimojo  and
Y. Higo
G. P. Zhang
Affiliation:
Precision and Intelligence Laboratory, Tokyo Institute of Technology 4259 Nagatsuta-cho, Midori-ku, Yokohama, 226-8503, Japan
K. Takashima
Affiliation:
Precision and Intelligence Laboratory, Tokyo Institute of Technology 4259 Nagatsuta-cho, Midori-ku, Yokohama, 226-8503, Japan
M. Shimojo
Affiliation:
Precision and Intelligence Laboratory, Tokyo Institute of Technology 4259 Nagatsuta-cho, Midori-ku, Yokohama, 226-8503, Japan
Y. Higo
Affiliation:
Precision and Intelligence Laboratory, Tokyo Institute of Technology 4259 Nagatsuta-cho, Midori-ku, Yokohama, 226-8503, Japan
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Abstract

In this study, deformation behavior of fine-grained austenitic stainless steel micro-cantilever beams was investigated using a newly developed testing machine for micro-sized specimens. The microbeams were deformed to different strain hardening stages of the material, and then the detailed deformation behavior on the specimen surface at the corresponding strain hardening stage was examined by scanning electron microscopy. Two deformation mechanisms corresponding to different strain hardening stages were found in the micro-sized austenitic stainless steel with fine grains. The dislocation slip mechanism characterized by the extensive dislocation slips and their interaction with grain boundaries resulted in the stage I strain hardening. With increasing deformation, the grain boundary sliding (GBS) mechanism at the stage II and subsequently intergranular cracking occurred. The differences in stress condition and work-hardening behavior on the top tension-side and rear compression-side surfaces of the micro-cantilever beam resulted in the different deformation behavior.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 657: Symposia EE – Materials Science of Microelectromechanical Systems (MEMS) Devices III , 2000 , EE5.10
Copyright
Copyright © Materials Research Society 2001

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References

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