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Defect Generation by Proton Irradiation of Semi-Insulating Lec GaAs
Published online by Cambridge University Press: 15 February 2011
Abstract
High energy and high fluence proton irradiated semi-insulating GaAs has been studied by EBIC, PL mapping, C-V, NTSC, PICTS and p-DLTS. The main defects generated by the irradiation were analyzed. An EL2-like defect was found to be dominant. The generation of this defect annihilates the typical cellular distribution of EL2 in as-grown material. The generated EL2 defects present a different photoquenching behavior than the as-grown EL2 defects.
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- Copyright © Materials Research Society 1999
References
4.
Martin, G.M. and Makram-Ebeid, S.; in Deep Centers in Semiconductors, ed. by Pantelides, S.T. (Gordon and Breach Science publishers
1986), p. 399.Google Scholar
5.
Alietti, M, Canali, C, Castaldini, A, Cavallini, A, Cetronio, A, Chiossi, C, , D'Auria, Del Papa, C, Lanzieri, C, Nava, F and Vanni, P, 1995
Nucl. Instr. & Meth. Phys. Res.
B90, 344.Google Scholar
6.
Look, D.C.; in Electrical characterization of GaAs materials and devices (John Wiley & Sons, Chichester
1989).Google Scholar
9.
Kuriyama, K, Takahashi, H, Kawahara, H, Hayashi, N, Watanabe, H, Sakamoto, I and Kohno, I; 1990
J. Appl. Phys.
68, 6517.Google Scholar
10.
Kuriyama, K, Kawahara, H, Satoh, M and Kawakubo, T; 1988
Appl. Phys. Lett.
53, 1074.Google Scholar
12.
Alvarez, A, Jimenez, J, Gonzalez, M A and Sanz, L F; 1997
Appl. Phys. Lett
70, 3131.Google Scholar