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Defect Analysis In Substrate Materials for High Tc Superconducting Thin Films

Published online by Cambridge University Press:  15 February 2011

P. R. Fletcher ,
C. Leach ,
F. Wellhofer  and
P. Woodall
P. R. Fletcher
Affiliation:
Department of Materials, Imperial College, Prince Consort Road, LONDON. SW7 2BP. U.K.
C. Leach
Affiliation:
Department of Materials, Imperial College, Prince Consort Road, LONDON. SW7 2BP. U.K.
F. Wellhofer
Affiliation:
High Tc Research Group, University of Birmingham, BIRMINGHAM. B 15 2TT. U.K.
P. Woodall
Affiliation:
High Tc Research Group, University of Birmingham, BIRMINGHAM. B 15 2TT. U.K.
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Abstract

Many defects in high Tc superconducting films propagate from the substrate through to the film surface, disturbing the epitaxy at the interface and adversely affecting the physical properties of the film, particularly Jc. In this study the surface of Magnesium Oxide (100) single crystal substrates with different preparative treatments have been investigated using optical cathodoluminescence microscopy (CL), with a view to establishing its effect on the deposition of thin films of YBa2Cu3O7-δ superconductors.

CL excitations due to mechanically and chemically induced defects in the MgO substrate crystals are observed by optical CL microscopy. Several pre-deposition treatments have been compared in this way to determine the best preparation route for the substrates. Jc measurements indicate that the substrate surface quality is an important parameter in the production of high quality thin films especially for the fabrication of devices.

It is concluded that CL provides a powerful and rapid tool for MgO quality assessment before thin film deposition.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 341: Symposium F – Epitaxial Oxide Thin Films and Heterostructures , 1994 , 221
Copyright
Copyright © Materials Research Society 1994

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