Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-27T01:54:39.807Z Has data issue: false hasContentIssue false
  • English
  • Français

Damage generated by MeV-ion Beams on Titanium Surface in Oxidizing Environment

Published online by Cambridge University Press:  08 March 2011

Ngoc-Long Do ,
Nicolas Bérerd ,
Nathalie Moncoffre  and
Dominique Gorse-Pomonti
Ngoc-Long Do
Affiliation:
Laboratorie des Solides Irradiés, UMR CNRS 7642, Ecole Polytechnique, F-91128, Palaiseau Cedex, France
Nicolas Bérerd
Affiliation:
Institut de Physique Nucléaire de Lyon, UMR CNRS 5822, F-69622, Villeurbanne Cedex, France
Nathalie Moncoffre
Affiliation:
Institut de Physique Nucléaire de Lyon, UMR CNRS 5822, F-69622, Villeurbanne Cedex, France
Dominique Gorse-Pomonti
Affiliation:
Laboratorie des Solides Irradiés, UMR CNRS 7642, Ecole Polytechnique, F-91128, Palaiseau Cedex, France
Get access

Abstract

The study of the irradiation effects on titanium surfaces in oxidizing environment using multi-charged Argon ions in the MeV range shed into light the following points:-Significant oxide film thickening for the film grown at 500°C under irradiation at 4 and 9 MeV, by comparison with the TiO2 rutile film grown under same environmental conditions without irradiation;-Formation of large round –shaped craters, of diameter approaching 200 nanometers, at the titanium surface under irradiation at 500°C provided that the environment is enough oxidizing or provided that the metal surface is covered by a sufficiently thick oxide film.

Practically, and for the present system, the superficial craterization is observed if the thickness of the superficial oxide is equal to twice that of the native oxide (~3 nm).

Keywords

radiation effectsoxidationTi
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1298: Symposium Q/R/T – Advanced Materials for Applications in Extreme Environments , 2011 , mrsf10-1298-r04-04
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Burns, W.G., Marsh, W.R. and Walters, W.S., Radiat. Phys. Chem. 21, 259 (1983).Google Scholar
2. Lapuerta, S., Moncoffre, N., Jaffrézic, H., Millard-Pinard, N., Bérerd, N., Esnouf, C., Crusset, D., J. Applied Phys. 101, 064905 (2007).Google Scholar
3. Bérerd, N., Moncoffre, N., Chevarier, A., Jaffrézic, H., Faust, H. and Balanzat, E., Nucl. Instrum. Meth. B249, 513 (2006).Google Scholar
4. Trocellier, P., Serruys, Y., Miro, S., Bordas, E., Pellegrino, S., Vaubaillon, S., Ruault, M.O., Henry, S., Kaıtasov, O., Nucl. Instrum. Meth. B266, 3178 (2008).Google Scholar
5. Ngoc-Long, Do, Yang, Feng and Gorse, D., in preparation for J. Applied Phys. Google Scholar