Hostname: page-component-586b7cd67f-vdxz6 Total loading time: 0 Render date: 2024-11-27T00:55:35.822Z Has data issue: false hasContentIssue false

Crystallographic Processing of Scanning Tunneling Microscopy Images of Cobalt Phthalocyanines on Silver and Graphite

Published online by Cambridge University Press:  18 May 2011

P. Moeck
Affiliation:
Nano-Crystallography Group, Department of Physics, Portland State University, Portland, OR 97207-0751, U.S.A. *[email protected]. **[email protected]
J. Straton
Affiliation:
Nano-Crystallography Group, Department of Physics, Portland State University, Portland, OR 97207-0751, U.S.A. *[email protected]. **[email protected]
M. Toader
Affiliation:
Institute of Physics, Chemnitz University of Technology, D-09126 Chemnitz, Germany
M. Hietschold
Affiliation:
Nano-Crystallography Group, Department of Physics, Portland State University, Portland, OR 97207-0751, U.S.A. *[email protected]. **[email protected] Institute of Physics, Chemnitz University of Technology, D-09126 Chemnitz, Germany
Get access

Abstract

Monolayers of cobalt phthalocyanine (CoPc) and fluorinated cobalt phthalocyanine (F16CoPc) on silver (111) and on highly (0001) oriented pyrolytic graphite (HOPG) were imaged with a scanning tunneling microscope (STM) at cryogenic temperatures (around 30 K) at Chemnitz University of Technology. Domains of regular arrays with periodicity in two dimensions (2D) and a variety of plane symmetries were observed. Crystallographic image processing (CIP) was used to quantify deviations from the plane symmetry groups and to obtain symmetrized versions of the content of the average unit cells of some of these arrays. Conclusions on the point symmetry of the CoPc and F16CoPc molecules within the arrays were drawn.

Type
Articles
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Zou, X. and Hovmöller, S., in: Industrial Applications of Electron Microscopy, edited by Li, Z.R., Marcel Dekker, New York, 2003, p. 583614.Google Scholar
2. Oku, T., Solid State Commun. 127, 689 (2003).Google Scholar
3. Morgan, D. G., Ramasse, Q. M., and Browning, N. D., J. Electron Microsc. 58, 223 (2009).Google Scholar
4. Moeck, P., in: Microscopy: Science Technology, Applications and Education, Microscopy Book Series, Vol. 4, edited by Méndez-Vilas, A. and Diaz, J., 2010, http://www.formatex.org/microscopy4/.Google Scholar
5. Park, S. and Quate, C. F., J. Appl. Phys. 62, 312 (1987).Google Scholar
6. Hahn, T. (editor), International Tables for Crystallography. Brief Teaching Edition of Volume A, Space-group Symmetry, 5th revised edition, Chester, International Union of Crystallography, 2005.Google Scholar
7. Kanatani, K., Inter. J. of Computer Vision 26, 171 (1998).Google Scholar
8. Hietschold, M., Lackinger, M., Griessl, S., Heckl, W. M., Gopakumar, T. G., and Flynn, G. W., Microelec. Engin. 82, 207 (2005).Google Scholar
9. Curie, P., J. de Physique 3, 393 (1894); see, e.g., the geometric-structural crystallography textbook by S. M. Allen and E. L. Thomas, The Structure of Materials, John Wiley & Sons, New York, 1999.Google Scholar
10. Kataoka, T., Fukagawa, H., Hosoumi, S., Nebashi, K., Sakamoto, K., and Ueno, N., Chem. Phys. Lett. 451, 43 (2008).Google Scholar