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Critical Current Density of the YBa2Cu3O7-δ Superconductor as Affected by Microstructuralxontrol

Published online by Cambridge University Press:  28 February 2011

S. Jin
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
R. C Sherwood
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
T. H. Tiefel
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
R. B. van Dover
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
G. W. Kammlott
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
M. E. Davis
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
R. A. Fastnacht
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
S. Nakahara
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
M. F. Yan
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
D. W. Johnson Jr
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
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Abstract

The recent discovery of the YBa2Cu3O7-δ type high Tc superconductors stimulated worldwide R&D interest in this field. However, the relatively low critical current density (Jc) in the polycrystalline, bulk superconductors (as well as its significant deterioration in weak magnetic fields) has been a major roadblock to the rapid technical advancement toward applications. In this paper, we investigated the effect of processing and microstructural control on Jc of the superconductor. Improved Jc values of -3100 A/cm2 at 77K with somewhat reduced field dependence have been obtained through appropriate microstructural modifications.

Type
Research Article
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

[1] Wu, M. K., Ashburn, J. R., Thorng, C. J., Hor, P. H., Meng, R. L., Gao, L., Huang, Z. J., Wang, Y. Q., and Chu, C.W., Phys. Rev. Lett. 58, 908 (1987).Google Scholar
[2] Dinger, T. R., Worthington, T. K., Gallagher, W. J., and Sandstrom, R. L., Phys. Rev. Lett. 58, 2687 (1987).Google Scholar
[3] Jin, S., Sherwood, R. C., Tiefel, T. H., van Dover, R. B., and Johnson, D. W. Jr, Appl. Phys. Lett. 51, 203, (1987).Google Scholar
[4] Jin, S., Tiefel, T. H., Sherwood, R. C., Kammlott, G. W., and Zahurak, S. M., Appl. Phys. Lett. 51, 943 (1987).Google Scholar
[5] Johnson, D. W. Jr, Gyorgy, E. M., Rhodes, W. W., Cava, R. J., Feldman, L. C., and van Dover, R. B., Adv. Ceram. Mater. 2, 364 (1987).Google Scholar
[6] Poeppel, R. B., Flandermeyer, B. K., Dusek, J. T., and Bloom, I. D., Chemistry of High Temperature Superconductors, (American Chemical Society, Washington, DC; 1987), ACS Series 351, p. 261.Google Scholar
[7] Ekin, J. W., Panson, A. J., Braginski, A. I., Janocko, M. A., Hong, M., Kwo, J., Liou, S. H., Capone, D. W., and Flandermeyer, B., Proc., Symposium on High Temperature Superconductors (Materials Research Society, Pittsburgh, PA, 1987). Vol. EA–11, p. 223.Google Scholar
[8] Jin, S., Sherwood, R. C, Tiefel, T. H., van Dover, R. B., Johnson, D. W., and Grader, G. S., Appl. Phys. Lett., 51, 855 (1987).Google Scholar
[9] Schneemeyer, L. F., Gyorgy, E. M., and Waszczak, J. V. (unpublished).Google Scholar
[10] Farrel, D. E., Chandrasekhar, B. S., DeGuire, M. R., Fang, M. M., Kogan, V. G., Clem, J. R., and Finnemore, D. K., Phys. Rev. B, 36, 4025 (1987).Google Scholar
[11] O'Bryan, H. M. and Gallagher, P. K., Adv. Ceram. Mat. 2, 640 (1987).Google Scholar
[12] Jin, S., Tiefel, T. H., Sherwood, R. C., van Dover, R. B., Kammlott, G. W., Davis, M. E., and Fastnacht, R. A. (to be published).Google Scholar