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Correlation Between Electrical Properties and Composition / Microstructure of Si-C-N Ceramics
Published online by Cambridge University Press: 10 February 2011
Abstract
In this paper we report on the measurement of electrical properties of multielement ceramics in the ternary Si-C-N system using the impedance spectroscopy. The results were correlated to the chemical composition, the hybridization state and the microstructural characteristics investigated by chemical analysis, X-Ray absorption near edge spectroscopy (XANES), Raman Spectroscopy, high resolution transmission electron microscopy (HRTEM) and X-Ray powder diffraction (XRD).
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- Copyright © Materials Research Society 1998