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Copper oxide nanoparticles for thin film photovoltaics

Published online by Cambridge University Press:  27 February 2013

Maurice Nuys ,
Jan Flohre ,
Christine Leidinger ,
Florian Köhler  and
Reinhard Carius
Maurice Nuys
Affiliation:
Institute of Energy and Climate Research 5 -Photovoltaics-, Forschungszentrum Jülich GmbH, D-52425 Jülich Germany
Jan Flohre
Affiliation:
Institute of Energy and Climate Research 5 -Photovoltaics-, Forschungszentrum Jülich GmbH, D-52425 Jülich Germany
Christine Leidinger
Affiliation:
Institute of Energy and Climate Research 5 -Photovoltaics-, Forschungszentrum Jülich GmbH, D-52425 Jülich Germany
Florian Köhler
Affiliation:
Institute of Energy and Climate Research 5 -Photovoltaics-, Forschungszentrum Jülich GmbH, D-52425 Jülich Germany
Reinhard Carius
Affiliation:
Institute of Energy and Climate Research 5 -Photovoltaics-, Forschungszentrum Jülich GmbH, D-52425 Jülich Germany
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Abstract

Commercially available tenorite (CuO) nanoparticles (NPs) were investigated in particular with respect to their suitability for photovoltaic applications. NPs with a diameter of about 30 nm were step wise annealed up to 1000°C in nitrogen atmosphere. The influence of the annealing treatment on the structural and electronic properties was investigated by Raman, photoluminescence (PL) and photothermal deflection spectroscopy (PDS) as well as X-ray diffraction measurements. Size, shape, and phase of the untreated NPs are analyzed by TEM measurements. The PL and PDS results show a strong increase of the tenorite band edge emission at about 1.3 eV accompanied by a decreasing sub gap absorption with increasing annealing temperature up to 700°C. According to literature, a phase transition from tenorite to cuprite (Cu2O) was expected and observed after annealing at 800°C. Strong cuprite band edge emission at about 2 eV accompanied by very weak defect and possibly tenorite band edge emission was found for samples annealed at 800°C and 1000°C.

Keywords

nanostructureoptical propertiesphotovoltaic
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1494: Symposium F – Oxide Semiconductors and Thin Films , 2013 , pp. 333 - 338
Copyright
Copyright © Materials Research Society 2013 

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References

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