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Conductive Atomic Force Microscopy and Scanning Impedance Microscopy for the Imaging of Electrical Domain in CaCu3Ti4O12 Perovskite Oxide

Published online by Cambridge University Press:  31 January 2011

Raffaella Lo Nigro ,
Patrick Fiorenza  and
Vito Raineri
Raffaella Lo Nigro
Affiliation:
[email protected], IMM-CNR, catania, Italy
Patrick Fiorenza
Affiliation:
[email protected], IMM-CNR, catania, Italy
Vito Raineri
Affiliation:
[email protected], IMM-CNR, catania, Italy
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Abstract

Electrical characterization of CaCu3Ti4O12 (CCTO) ceramics with scanning probe based techniques has been carried out. In particular, conductive atomic force microscopy (C-AFM) and scanning impedance microscopy (SIM) have been used to demonstrate the presence, shape and size in CCTO ceramics of the different electrically domains, both at the grain boundaries and within the grains. The electrical characteristics of single grains and of single domains have been evaluated and it has been observed that the conductive grains are surrounded by insulating grain boundaries.

Keywords

ceramicdielectric propertiesscanning probe microscopy (SPM)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1232: Symposium OO – Dynamic Scanning Probes — Imaging, Characterization, and Manipulation , 2009 , 1232-OO07-01
Copyright
Copyright © Materials Research Society 2010

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