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Comparative Studies of Pb/Cu(001) by TEM, AFM and STM

Published online by Cambridge University Press:  10 February 2011

Franck Bocquet ,
Camille Cohen ,
Didier Schmaus ,
André Rocher ,
Jacques Crestou  and
Sèbastien Gauthier
Franck Bocquet
Affiliation:
GPS, Universitès Paris VI et VII, 2 Place Jussieu, F-75251, France
Camille Cohen
Affiliation:
GPS, Universitès Paris VI et VII, 2 Place Jussieu, F-75251, France
Didier Schmaus
Affiliation:
GPS, Universitès Paris VI et VII, 2 Place Jussieu, F-75251, France
André Rocher
Affiliation:
CEMES- CNRS, BP 4347 F-31055 Toulouse, France
Jacques Crestou
Affiliation:
CEMES- CNRS, BP 4347 F-31055 Toulouse, France
Sèbastien Gauthier
Affiliation:
CEMES- CNRS, BP 4347 F-31055 Toulouse, France
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Abstract

The same specimen of Pb/Cu grown under Ultra High Vacuum (UHV) conditions has been investigated by Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Transmission Electron Microscopy (TEM). We show that the information obtained by these techniques is consistent when comparable, and complementary. In particular, three different morphologies of Pb islands with specific orientation relationship are observed; AFM reveals the faceted shape of the islands; STM permits an accurate determination of the atomic structure of the facets; TEM moir6 patterns reveal that Pb islands are well relaxed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 528: Symposia AA – Mechanisms & Principals of Epitaxial Growth in Metallic Systems , 1998 , 19
Copyright
Copyright © Materials Research Society 1998

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