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Chemistry of Electrochromic IrOx. Films Deposited Under Variable Redox Conditions

Published online by Cambridge University Press:  16 February 2011

J. D. Klein
Affiliation:
EIC Laboratories, Norwood, MA 02062
S. L. Clauson
Affiliation:
EIC Laboratories, Norwood, MA 02062
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Abstract

A thin film deposition technique is described whereby the oxidation condition of as-deposited iridium oxide thin films can be manipulated by varying deposition conditions. Iridium oxide thin films were deposited by reactive rf magnetron sputtering in a H2/O2/Ar gas blend. Optical emission spectroscopy, an in-situ process monitor, was employed to observe redox interactions in the deposition plasma. The plasma spectra exhibited characteristics normally observed in hydrogen flame spectroscopy. A competitive redox balance was found to exist between atomic O and atomic H emissions. Plasma redox conditions defined by the H-O emissions could be accessed by a variety of gas flow conditions. Electrochemical aspects of the IrOx films were examined by cyclic voltammetry. Electrochromic capabilities were demonstrated through optical transmittance.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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