Hostname: page-component-586b7cd67f-g8jcs Total loading time: 0 Render date: 2024-11-25T18:00:45.152Z Has data issue: false hasContentIssue false

Chemical Vapor Deposition of SiO2 from Ozone-Organosilane Mixtures near Atmospheric Pressure

Published online by Cambridge University Press:  22 February 2011

K. V. Guinn
Affiliation:
AT&T Bell Laboratories, Murray Hill, N.J. 07974
J. A. Mucha
Affiliation:
AT&T Bell Laboratories, Murray Hill, N.J. 07974
Get access

Abstract

The kinetics of deposition of SiO2 by the reaction of tetramethylsilane (TMS) with ozone (O3) has been studied over the temperature range 180 – 380° C and compared with available data for the same process using tetraethoxysilane (TEOS). Both processes exhibit the same activation energy (17 kcal/mole) below 300 ° C which falls-off at higher temperatures due to transport limitations. Transition from first- to zero-order kinetics occurs with increasing concentrations of TMS and O3, which gives an overall O3/TMS consumption ratio of 10 at 258° C and5 at 325° C. TEOS is estimated to be 5 times more reactive than TMS above 300° C and over 10 times more reactive in the kinetically-limited regime below 300° C. Results suggest that O3-induced SiO2 deposition proceeds via surface reactions and is limited by heterogeneous decomposition of ozone.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[l] Fujino, K., Nishimoto, Y., Tokumasu, N. and Maeda, K., J. Electrochem. Soc., 137, 2883 (1990).Google Scholar
[2] Fujino, K., Nishimoto, Y., Tokumasu, N. and Maeda, K., J. Electrochem. Soc., 139, 2282 (1992).Google Scholar
[3] Nguyen, B.. Applied Materials Corp., private communication (1992).Google Scholar
[4] Benson, S. W. and Axworthy, A. E. Jr, J. Chem. Phys., 26, 1718 (1957).Google Scholar
[5] Hertl, W. and Hair, M. L., J. Phys. Chem., 72, 4676 (1968).Google Scholar
[6] Fujino, K., Nishimoto, Y., Tokumasu, N. and Maeda, K., J. Electrochem. Soc., 138, 3019 (1991).Google Scholar