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The Chemical Environment Of Er3+ In A-Si:Er:H And A-Si:Er:O:H
Published online by Cambridge University Press: 10 February 2011
Abstract
We have measured extended x-ray absorption fine structure (EXAFS) of the Er LIII edge in a-Si:Er:O:H with different concentrations of Er and O. The samples were prepared by reactive RF co-sputtering from a silicon target partially covered with metallic erbium platelets. They present the characteristic Er 3+ photoluminescence at 1.54 μm as deposited. The FFT of the Er EXAFS provides two well separated peaks. The characteristics of the first peak resemble those of Er2O3. We associate the first neighbor shell with oxygen atoms, even in non intentionally oxygenated samples. The average coordination and Er-O separation are significantly smaller than in Er2O3. This may be the reason why Er3+ luminescence in a-Si:H presents small temperature quenching. The second shell is interpreted as being composed of silicon atoms.
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- Copyright © Materials Research Society 1998