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Characterization of the Degradation Processes in the Buried Heterostructure Quantum Well Laser Diodes Using Internal Second Harmonic Emission

Published online by Cambridge University Press:  21 February 2011

A. T. Lupu ,
A. V. Syrbu ,
A. Z. Mereutza ,
V. P. Yakovlev ,
I. V. Kravetsky  and
L. L. Kulyuk
A. T. Lupu
Affiliation:
Technical University of Moldova, 168 Stefan eel Mare str., Chisinau, 277012, Moldova.
A. V. Syrbu
Affiliation:
Technical University of Moldova, 168 Stefan eel Mare str., Chisinau, 277012, Moldova.
A. Z. Mereutza
Affiliation:
Technical University of Moldova, 168 Stefan eel Mare str., Chisinau, 277012, Moldova.
V. P. Yakovlev
Affiliation:
Technical University of Moldova, 168 Stefan eel Mare str., Chisinau, 277012, Moldova.
I. V. Kravetsky
Affiliation:
Institute of Applied Physics, Moldova Academy of Sciences, Academic Street 5, Chisinau, 277028, Moldova.
L. L. Kulyuk
Affiliation:
Institute of Applied Physics, Moldova Academy of Sciences, Academic Street 5, Chisinau, 277028, Moldova.
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Abstract

Characterization of the degradation processes of single mode buried heterostructure quantum well laser diodes using traditional electrooptical parameters as well as the parameters of internal second harmonic radiation (SHR) were performed. In order to observe the stages of degradation process, especially in the vicinity of catastrophic optical damage of the laser mirror, single current pulses were superimposed on DC driving current. It was shown that the intensity of SHR is indicative of the laser diode mirror working regime: the bigger SHR intensity corresponds to the bigger optical power density on the mirror and the higher risk of mirror catastrophic optical damage.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 355: Symposium B1 – Evolution of Thin-Film and Surface Structure and Morphology , 1994 , 525
Copyright
Copyright © Materials Research Society 1995

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References

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