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Characterization of Surface Defect Structure by Low Energy Electron Diffraction*

Published online by Cambridge University Press:  25 February 2011

J. F. Wendelken ,
G. -C. Wang ,
J. M. Pimbley  and
T. -M. Lu
J. F. Wendelken
Affiliation:
Oak Ridge National Laboratry, Oak Ridge, TN 37831
G. -C. Wang
Affiliation:
Oak Ridge National Laboratry, Oak Ridge, TN 37831
J. M. Pimbley
Affiliation:
Center for Nntegrated Electronics, Rensselaer Polytechnic Institute, Troy, NY 12181 Also, General Electric Company, Schnectady, NY 12345.
T. -M. Lu
Affiliation:
Center for Nntegrated Electronics, Rensselaer Polytechnic Institute, Troy, NY 12181
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Abstract

Low energy electron diffraction is a surface sensitive tool which is most widely used for the determination of surface symmetries and equilibrium atomic positions. Experimental and theoretical advances made in the past five years make it possible now to use LEED also for the characterization of a wide variety of surface defect structures. In this paper a variety of experimental results involving analysis of diffracted electron beam shapes as a function of primary electron beam energy, adsorbate coverage, crystal tem-perature and ordering time are presented. These experimental results coupled with kinematic theory, allow the determination of step density, size and shape of reconstruction domains and overlayer islands, island size distribution in an overlayer during growth, and the mode of growth.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 41: Symposium K – Advanced Photon and Particle Techniques for the Characterization of Defects in Solids , 1984 , 171
Copyright
Copyright © Materials Research Society 1985

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Footnotes

**

Permanent address: Physics Department, Rensselaer Polytechnic Institute, Troy, NY 12181.

*

Research sponsored by the Division of Materials Sciences, U.S. Department of Energy under contract DE-ACO5-840R21400 with Martin Marietta Energy Systems, Inc.

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