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Characterization of Sic Fibers by Soft X-Ray Photoelectron and Photoabsorption Spectroscopies and Scanning Auger Microscopy

Published online by Cambridge University Press:  15 February 2011

Qing Ma ,
M. W. Mcdowell  and
R. A. Rosenberg
Qing Ma
Affiliation:
Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439
M. W. Mcdowell
Affiliation:
Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439
R. A. Rosenberg
Affiliation:
Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439
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Abstract

Synchrotron radiation soft x-ray photoelectron and photoabsorption spectroscopy was used to characterize commercially obtained SiC fibers, which were produced by chemical vapor deposition (CVD) of SiC on a W core, followed by a carbon passivating layer. Depth profiling of the fiber through the carbon/SiC interface was done by making Si 2p and C ls core level PES and PAS, as well as scanning Auger microscopy, measurements following Ar+ sputtering. No significant changes in either photoemission or absorption or Auger line shapes were observed as a function of the depth, which indicates that there is no significant interfacial reaction. The line shapes of the carbonaceous coatings are predominately graphite-like and those of the CVD SiC coatings are microcrystalline, with presence of disorder to some extent in both cases.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 437: Symposium DD – Applications of Synchrotron Radiation to III , 1996 , 219
Copyright
Copyright © Materials Research Society 1996

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