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Characterization of Pzt Films by Scanning Force Microscopy (SFM)

Published online by Cambridge University Press:  10 February 2011

Genaro Zavala ,
Susan E. Trolier-McKinstry  and
Janos H. Fendler
Genaro Zavala
Affiliation:
Department of Chemistry, Syracuse University, Syracuse, NY 13244–4100
Susan E. Trolier-McKinstry
Affiliation:
149 Materials Research Laboratory, The Pennsylvania State University, University Park, PA 16802
Janos H. Fendler
Affiliation:
Department of Chemistry, Syracuse University, Syracuse, NY 13244–4100
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Abstract

Scanning Force Microscopy (SFM) has been used for the determination of friction, phase transformation, piezoelectric behavior (contact mode), polarization state and dielectric constant (non contact mode) in several nanometer regions of Lead Zirconate Titanate (PZT) films. The use of the SFM tip, in the contact mode, to polarize different nanoregions of the film and to apply an oscillating field thereon, led to effective piezoelectric coefficients and piezoelectric loops. In the non-contact mode, application of an ac signal (frequency ω) to the tip-electrode system produced an oscillation of the tip at ω (fundamental or first harmonic) and 2ω (second harmonic). The signals ω and 2ω were related to the state of polarization and the dielectric constant of the film. Analysis of the combined contact, non-contact and friction force microscopic data have provided considerable insight into the piezoelectricity and polarization in the nanodomains.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 433: Symposium T – Ferroelectric Thin Films V , 1996 , 437
Copyright
Copyright © Materials Research Society 1996

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