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Characterization of mechanical, optical and structural properties of bismuth oxide thin films as a write-once medium for blue laser recording
Published online by Cambridge University Press: 04 February 2014
Abstract
We report on the preparation and characterization of crystalline bismuth oxide thin films via Biased Target Ion Beam Deposition method. A focused blue laser (405nm) is used to write an array of dots in the bismuth oxide thin film and demonstrate clear and circular recording marks in form of “bubbles” or “little volcanos” (FWHM ∼500nm). Results indicate excellent static recording characteristics, writing sensitivity and contrast. The recording mechanism is investigated and is believed to be related to laser-induced morphology change.
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- Information
- MRS Online Proceedings Library (OPL) , Volume 1633: Symposium R – Oxide Semiconductors , 2014 , pp. 87 - 92
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- Copyright © Materials Research Society 2014
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