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Characterization of Grain Boundaries in Electronic Ceramics by Transmission Electron Microscopy

Published online by Cambridge University Press:  15 February 2011

David R. Clarke
David R. Clarke*
Affiliation:
Rockwell International Science CenterThousand Oaks, CA 91360
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Abstract

The principal high resolution transmission electron microscopy techniques used in characterizing grain boundaries in electronic ceramics are described, including those recently developed for detecting the presence of extremely thin (∼10Å) intergranular phases. The capabilities of the techniques are illustrated with examples drawn from studies of ZnO varistors, PTC BaTiO3 devices and boundary layer capacitors.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 5: Symposium B – Grain Boundaries in Semiconductors , 1981 , 3
Copyright
Copyright © Materials Research Society 1982

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References

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