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Characterization of Epitaxial Superconducting YBacuO Thin Films with Three Different Orientations

Published online by Cambridge University Press:  28 February 2011

X.K. Wang
Affiliation:
Materials Research Center and Science & Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208
D.X. Li
Affiliation:
Materials Research Center and Science & Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208
S.N. Song
Affiliation:
Materials Research Center and Science & Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208
J.Q. Zheng
Affiliation:
Materials Research Center and Science & Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208
R.P.H. Chang
Affiliation:
Materials Research Center and Science & Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208
J.B. Ketterson
Affiliation:
Materials Research Center and Science & Technology Center for Superconductivity, Northwestern University, Evanston, IL 60208
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Abstract

Epitaxial thin films of YBaCuO were prepared by multilayer deposition from Y, Cu, and BaF2 sources with: (1) the a‐axis perpendicular to (100)SrTiO3; (2) the c‐axis perpendicular to (100)SrTiO3; and (3) the [110] axis perpendicular to (110)SrTiO3. XRD patterns as well as SEM and HREM images confirm that the films are highly oriented, essentially epitaxial. Both the a‐axis oriented and the c‐axis oriented films exhibit zero resistance at 91K. The [110] oriented film shows the sharpest transiton with a transition width of IK and zero resistance at 85K. The zero field critical current density, Jc, determined magnetically, is in excess of 107A/cm2 at 4.4K and 1.04 x 106A/cm2 at 77K for the c‐axis oriented film; for the a‐axis oriented film we obtained 6.7 x 106A/cm2 at 4.4K and 1.2 x 105A/cm2 at 77K. The orientation dependence of the critical current density in the basal plane of the a‐axis oriented film was studied. The largest Jc's occur along the in‐plane <100> axes of the substrate.

Type
Research Article
Copyright
Copyright © Materials Research Society 1990

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