Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-08T07:23:31.079Z Has data issue: false hasContentIssue false

Characterization of Cd1-x ZnxTe Alloys Using Infrared Reflectivity and Raman Scattering Spectroscopy

Published online by Cambridge University Press:  22 February 2011

D. N. Talwar
Affiliation:
Department of Physics, Indiana University of Pennsylvania, Indiana, PA, 15705-1087
Z. C. Feng
Affiliation:
Department of Physics, National University of Singapore, Singapore 0511
P. Becla
Affiliation:
Francis Bitter National Magnet Laboratory, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
Get access

Abstract

Study of impurity-induced phonon disordering in Cdl-xZnxTe alloys is reported for a variety of samples by using far-infrared reflectivity and Raman scattering spectroscopy. Substantial differences were noted among the various published values for the optical phonon frequencies versus x. Contrary to an earlier Raman study on MBE grown Cdl-xZnxTe/GaAs films, our results within a twomode behavior, yield an increase of both the CdTe- and ZnTe-like transverse optical phonons with x. Unlike earlier speculations for a gap-mode in ZnTe : Cd of ∼140∼145 cm−1, our Greens function theory predicts it to be at a relatively higher frequency of ∼153 cm−1.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. See for example, Dornhaus, R. and Nimitz, G., in Narrow Gap Semiconductors, edited by Höhler, G. and Niekisch, E. A. (Springer, Berlin 1983), pp. 119300.CrossRefGoogle Scholar
2. See for example, Semiconductor Science and Technology 6, 12C (1991) Proceedings of the NATO Workshop on Narrow Gap Semiconductors, Oslo, Norway June 25-27, 1991.Google Scholar
3. See for example, Bernasconi, M., in Phonons: Theory and Experiment III, edited by Brüesch, P. (Springer, Heidelberg, 1987); D. W. Taylor, in Optical Properties of Mixed Crystals, edited by R. J. Elliott and I. P. Ipatova (North-Holland, 1988) p. 35.Google Scholar
4. Talwar, D. N., Feng, Z. C. and Becla, P., Phys. Rev. B15 (in press)Google Scholar
5. Olego, D. J., Raccah, P. M., and Faurie, J. P., Phys. Rev. B33, 3819 (1986).CrossRefGoogle Scholar
6. Vagelatos, N., Wehe, D. and King, J. S., J. Chem. Phys. 60, 3613 (1974).CrossRefGoogle Scholar
7. Talwar, D. N., Suh, K. S. and Ting, C. S., Phil. Mag. B56, 593 (1987).CrossRefGoogle Scholar