Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-06T11:06:54.009Z Has data issue: false hasContentIssue false

Characterization of a Pulsed Arc Cluster Ion Source for the Production of Metal Clusters in Molecular Beams.

Published online by Cambridge University Press:  15 February 2011

P. Piseri
Affiliation:
INFM-Dipartimento di Fisica, Universita' di Milano, Via Celoria 16, 20133 Milano, Italy
E. Barborini
Affiliation:
INFM-Dipartimento di Fisica, Universita' di Milano, Via Celoria 16, 20133 Milano, Italy
P. Milani
Affiliation:
INFM-Dipartimento di Fisica, Universita' di Milano, Via Celoria 16, 20133 Milano, Italy INFN, Sezione di Milano, Via Celoria 16, 20133 Milano, Italy
Get access

Abstract

We have produced metal clusters with a molecular beam apparatus based on a Pulsed Arc Cluster Ion Source. The source has been optimized in order to generate intense and stable cluster beams of various elements, with a mass distribution ranging from the monomer up to several thousands of atoms. The source operation conditions can be varied in order to control the mass distribution, intensity and velocity of the aggregates. Preliminary results on the synthesis of granular thin films with this technique are also presented.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Gleiter, H., Progress in Materials Science 33, p. 223 (1989).Google Scholar
2. Hahn, H. and Averback, R.S., J. Appl. Phys. 67, p. 1113 (1990)Google Scholar
3. Teng, M.H. et al. , J. Mater. Res. 10, p. 233 (1995)Google Scholar
4. El-Shall, M.S., Slack, W., Vann, W, Kane, D., and Hanley, D., J. Phys. Chem. 98, p. 3067 (1994).Google Scholar
5. Milani, P., and deHeer, W.A., Rev. Sci. Instrum. 61, p. 1835 (1990).Google Scholar
5. Cha, C.Y., Gantefoer, G., and Eberhardt, W., Rev. Sci. Instrum. 63, p. 5661 (1992)Google Scholar
6. Gantefoer, G., Siekmann, H.R., Lutz, H.O., and Meiwes-Broer, K.H., Chem. Phys. Lett. 165, p. 293 (1990).Google Scholar
7. Miller, D.R. in Atomic and Molecular Beam Methods, edited by Scoles, G. (Oxford University Press, New York, 1988) p. 4451.Google Scholar
8. Valkealahti, S., Naeher, U. and Manninen, M., Phys. Rev. B 51, p.11039 (1994)Google Scholar
9. Siekmann, H.R., Holub-Krappe, E., Wrenger, Bu., Pettenkofer, Ch. and Meiwes-Broer, K.H., Z. Phys. B 90, p. 201 (1993).Google Scholar