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Characterization and Statistical Distribution of Grain Boundaries in Ni3Al
Published online by Cambridge University Press: 26 February 2011
Abstract
Grain Boundaries in two specimens of Ni4Al of different compositions and mechanical behavior were studied by electron microscopy. SEM was used to determine the distribution of Σ values in both samples. TEM results were combined with CSL theory to completely characterize the nature of the boundaries, including Σ values and the grain boundary plane orientation. The boundaries most commonly observed in the experiments were also studied using a computer simulation technique and the results correlated with the experimental observations.
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- Copyright © Materials Research Society 1988
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