Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-19T04:42:40.962Z Has data issue: false hasContentIssue false
  • English
  • Français

Characterization And Properties Of The AIPdMn 5 Surface

Published online by Cambridge University Press:  10 February 2011

G. Cappello ,
A. Dechelette ,
F. Schmithusen ,
J. Chevrier ,
F. Comin ,
A. Stierle ,
V. Formoso ,
M. De Boissieu ,
T. Lograsso  and
C. Jenks
...Show all authors
G. Cappello
Affiliation:
LEPES CNRS Grenoble BP 166 38042 Grenoble cedex 9 France ESRF BP220 F-38043 Grenoble Cedex France
A. Dechelette
Affiliation:
LEPES CNRS Grenoble BP 166 38042 Grenoble cedex 9 France ESRF BP220 F-38043 Grenoble Cedex France
F. Schmithusen
Affiliation:
LEPES CNRS Grenoble BP 166 38042 Grenoble cedex 9 France ESRF BP220 F-38043 Grenoble Cedex France
J. Chevrier
Affiliation:
LEPES CNRS Grenoble BP 166 38042 Grenoble cedex 9 France ESRF BP220 F-38043 Grenoble Cedex France
F. Comin
Affiliation:
ESRF BP220 F-38043 Grenoble Cedex France
A. Stierle
Affiliation:
ESRF BP220 F-38043 Grenoble Cedex France
V. Formoso
Affiliation:
ESRF BP220 F-38043 Grenoble Cedex France
M. De Boissieu
Affiliation:
LTPCM INPG BP 75 38402 Saint Martin d'Hères France
T. Lograsso
Affiliation:
Ames Laboratory/Iowa State University, Ames, IA 50011, USA
C. Jenks
Affiliation:
Ames Laboratory/Iowa State University, Ames, IA 50011, USA
D Delaney
Affiliation:
Ames Laboratory/Iowa State University, Ames, IA 50011, USA
Get access

Abstract

The surface of the AlPdMn quasicrystal perpendicular to a fivefold axis has been probed by LEED, XPS, Auger spectroscopy and surface EXAFS.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 553: Symposium LL – Quasicrystals , 1998 , 243
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Schaub, T. M., Bürgler, D. E., Güntherodt, H. -J., and Suck, J. -B., Phys. Rev. Lett., 73, pp. 1255–1258, (1994).Google Scholar
2. Gierer, M., Hove, M. A. Van, Goldman, A. I., Shen, Z., Chang, S. -L., Jenks, C. J., Anderegg, J. W., Zhang, C. -M., Chin, W. B., and Thiel, P. A., Physical Review B, 57, pp. 7628–7641, (1998).Google Scholar
3. Naumovic, D., Aebi, P., Schlapbach, L., Beeli, C.: "New Horizons in Quasicrystals ", p.86, edited by Goldman, A. I., Sordelet, D. J., Thiel, P. A. and Dubois, J. M., World Scientific, Singapore, (1997)Google Scholar
4. Capitan, M., Joulaud, J. L., Alvarez, J., and Calvayrac, Y., submitted to Phys. Rev. BGoogle Scholar
5. Janot, C. and Dubois, J. M., Les Quasicristaux: matières à paradoxes, Ed. EDP Sciences, (1998); Ko, J. S., Gellman, A. J., Lograsso, T. A., Jenks, C. J. and Thiel, P. A., Surf. Sci., in press.Google Scholar
6. Ebert, Ph., Yue, F., and Urban, K., Physical Review B 57, pp. 2821–2825 (1998).Google Scholar
7. Jenks, C. J., Delaney, D. W., Bloomer, T. E., Chang, S. -L., Lograsso, T. A., Shen, Z., Zhang, C. -M., and Thiel, P. A., Applied Surface Science 103, 485–493 (1996).Google Scholar
8. Bolliger, B., Erbudak, M., Vvedensky, D. D. and Zurkirch, M., Phys. Rev. Lett., 80, pp. 5369–5372, (1998)Google Scholar
9. Thiel, P. A., communication at Quasicrystal Symposium Strasbourg, april (1998)Google Scholar
10. Jenks, C. J., Chang, S. -L., Anderegg, J. W., Thiel, P. A., and Lynch, D. W., Physical Review B 54, pp. 6301–6306, (1996).Google Scholar
11. Wu, X., Kycia, S. W., Olson, C. G., Benning, P. J., Goldman, A. I. and Lynch, D. W., Phys. Rev. Lett. 75, (1995), pp. 4540–4543 Google Scholar
12. Schaub, T., Guyot, H., Delahaye, J., Berger, C. and Calvayrac, Y., LURE experimental report (1998)Google Scholar
13. Boudard, M., Boissieu, M. de, Janot, C., Heger, G., Beeli, C., Nissen, H. U., J. Phys.: Cond. Matter 4, (1992), 10149–10168 Google Scholar
14. Aberdam, D., J. of Synch. Rad., in pressGoogle Scholar
15. Stern, E. A. and Sayers, D. E., Lytle, W., Phys.Rev.B 11, pp. 1951–1960, (1975)Google Scholar
16. Jenks, C. J., Pinhero, P. J., Bloomer, T. E., Chang, S. -L., Anderegg, J. W. and Thiel, P. A., in Proceedings of Sixth International Conference on Quasicrystals, edited by Takeuchi, S. and Fujiwara, T., World Scientific, Singapore, (1998), 761–764.Google Scholar
17. Gavatz, M., Rouxel, D., Pigeat, P., Weber, B., and Dubois, J. M., submitted to Phil. Mag.Google Scholar
18. Cappello, G., Dechelette, A.. Schmithusen, F., Chevrier, J., Comin, F., Stierle, A., Formoso, V., Boissieu, M. de, Goldman, A., Lograsso, T., Jenks, C. and Delaney, D., in preparationGoogle Scholar
19. Chevrier, J., Cappello, G., Comin, F. and Palmari, J. P., "New Horizons in Quasicrystals ", p.144–151, edited by Goldman, A. I., Sordelet, D. J., Thiel, P. A. and Dubois, J. M., World Scientific, Singapore, (1997)Google Scholar