Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-23T15:17:43.213Z Has data issue: false hasContentIssue false

CdSxTe1-x Alloying in CdS/CdTe Solar Cells

Published online by Cambridge University Press:  20 July 2011

Joel N. Duenow
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401
Ramesh G. Dhere
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401
Helio R. Moutinho
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401
Bobby To
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401
Joel W. Pankow
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401
Darius Kuciauskas
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401
Timothy A. Gessert
Affiliation:
National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401
Get access

Abstract

A CdSxTe1-x layer forms by interdiffusion of CdS and CdTe during the fabrication of thinfilm CdTe photovoltaic (PV) devices. The CdSxTe1-x layer is thought to be important because it relieves strain at the CdS/CdTe interface that would otherwise exist due to the 10% lattice mismatch between these two materials. Our previous work [1] has indicated that the electrical junction is located in this interdiffused CdSxTe1-x region. Further understanding, however, is essential to predict the role of this CdSxTe1-x layer in the operation of CdS/CdTe devices. In this study, CdSxTe1-x alloy films were deposited by radio-frequency magnetron sputtering and coevaporation from CdTe and CdS sources. Both radio-frequency-magnetron-sputtered and coevaporated CdSxTe1-x films of lower S content (x<0.3) have a cubic zincblende (ZB) structure akin to CdTe, whereas those of higher S content have a hexagonal wurtzite (WZ) structure like that of CdS. Films become less preferentially oriented as a result of a CdCl2 heat treatment at ∼400°C for 5 min. Films sputtered in a 1% O2/Ar ambient are amorphous as deposited, but show CdTe ZB, CdS WZ, and CdTe oxide phases after a CdCl2 heat treatment. Films sputtered in O2 partial pressure have a much wider bandgap than expected. This may be explained by nanocrystalline size effects seen previously [2] for sputtered oxygenated CdS (CdS:O) films.

Type
Research Article
Copyright
Copyright © Materials Research Society 2011

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1 Dhere, R.G., Zhang, Y., Romero, M.J., Asher, S.E., Young, M., To, B., Noufi, R., and Gessert, T.A., Proc. of the 33rd Photovoltaic Specialists Conference (IEEE, San Diego, CA, 2008).Google Scholar
2 Wu, X., Yan, Y., Dhere, R.G., Zhang, Y., Zhou, J., Perkins, C., and To, B., phys. stat. sol. (c) 1, 10621066 (2004).Google Scholar
3 Dhere, R.G., Ph.D. Thesis, University of Colorado, 1997.Google Scholar
4 Ohata, K., Saraie, J., and Tanaka, T., Japan. J. Appl. Phys. 12, 11981204 (1973).Google Scholar
5 Ohata, K., Saraie, J., and Tanaka, T., Japan. J. Appl. Phys. 12, 16411642 (1973).Google Scholar
6. Jensen, D.G., Ph.D. Thesis, Stanford University, 1997.Google Scholar
7 Jensen, D.G., McCandless, B.E., and Birkmire, R.W., Proc. of the 25th Photovoltaic Specialists Conference(IEEE, Washington, D.C., 1996).Google Scholar
8 McCandless, B.E., Hanket, G.M., Jensen, D.G., and Birkmire, R.W., J. Vac. Sci. Technol. A 20, 14621467 (2002).Google Scholar
9 Pankove, J.I., Optical Processes in Semiconductors (Dover Publications, Inc., New York, NY, 1971).Google Scholar