Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-19T16:41:29.207Z Has data issue: false hasContentIssue false
  • English
  • Français

Cation Ordering Structure in La0.8Ca0.2MnO3 Thin Films by Pulsed Laser Deposition

Published online by Cambridge University Press:  10 February 2011

Y. H. Li ,
M. Rajeswari ,
A. Biswasl ,
D. J. Kang ,
C. Sehmen ,
L. Salamanca-Riba ,
R. Ramesh  and
T. Venkatesan
Y. H. Li
Affiliation:
NSF-MRSEC and Dept. of Materials and Nuclear Engineering and Center for Superconductivity Research, University of Maryland, College Park, MD 20742
M. Rajeswari
Affiliation:
Center for Superconductivity Research, University of Maryland, College Park, MD 20742
A. Biswasl
Affiliation:
Center for Superconductivity Research, University of Maryland, College Park, MD 20742
D. J. Kang
Affiliation:
Center for Superconductivity Research, University of Maryland, College Park, MD 20742
C. Sehmen
Affiliation:
Center for Superconductivity Research, University of Maryland, College Park, MD 20742
L. Salamanca-Riba
Affiliation:
NSF-MRSEC and Dept. of Materials and Nuclear Engineering and Center for Superconductivity Research, University of Maryland, College Park, MD 20742
R. Ramesh
Affiliation:
NSF-MRSEC and Dept. of Materials and Nuclear Engineering and Center for Superconductivity Research, University of Maryland, College Park, MD 20742 Center for Superconductivity Research, University of Maryland, College Park, MD 20742
T. Venkatesan
Affiliation:
Center for Superconductivity Research, University of Maryland, College Park, MD 20742
Get access

Abstract

A careful analysis of high-resolution transmission electron microscopy images from La0.8Ca0.2MnO3 thin films indicates that the images can not explained based on either the classical Pnma structure or its monoclinic distortion. A cation ordered structure is proposed which could be responsible for the significantly higher Tc of the film (298K) compared with the bulk material of the same composition (190K).

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 602: Symposium JJ – Magnetoresistive Oxides & Related Materials , 1999 , 81
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Chahara, K., Ohno, Y., Kasai, M. and Kosono, Y., Appl. Phys. Lett. 63, p. 1990 (1993).Google Scholar
2. Jin, S., Tiefel, T. H., McCromack, M., Fastnatch, R. A., Ramesh, R. and Chen, L. H., Science 264, p.413 (1994)Google Scholar
3. Millis, A. J., Littlewood, P. B., Shraiman, B. I., Phys. Rev. Lett. 74, p.514 (1995)Google Scholar
4. Hwang, H. Y., Palstra, T. T. M., Cheong, S. W. and Batlogg, B., Phys. Rev. B 52, p. 15,046 (1995)Google Scholar
5. Millis, A. J., Goyal, A., Rajeswari, M., Ghosh, K., Shreekala, R., Greene, R. L., Ramesh, R. and Venkatesan, T., Appl. Phys. Lett. (unpublished).Google Scholar
6. Millis, A. J., Darling, T. and Migliori, A., J. Appl. Phys. 83, p. 1,588(1998)Google Scholar
7. Takenaka, K., Iida, K., Sawaki, Y., Sugai, S., Moritomo, Y. and Nakamura, A. (unpublished).Google Scholar
8. Hwang, H. Y., Cheong, S. W., Ong, N. P. and Batlogg, B., Phys. Rev. Lett. 77, p.2,041 (1996)Google Scholar
9. Mathur, N. D., Burnell, G., Isaac, S. P., Jackson, T. J., Teo, B. S., MacManus-Driscoll, J. L., Cohen, L. F., Evetts, J. E. and Blamire, M. G., Nature (London) 387, p.266(1997)Google Scholar
10 Gu, J. Y., Ogale, S. B., Rajeswari, M., Venkatesan, T., Ramesh, R., Radmilovic, V., Dahmen, U., Thomas, G. and Noh, T. W., Appl. Phys. Lett. 72, p.1,113(1998)Google Scholar
11. Shreekala, R., Rajeswari, M., Ghosh, K., Goyal, A., Gu, J. Y., Kwon, C., Trajauovic, Z., Boettcher, T., Greene, R. L., Ramesh, R. and Venkatesan, T., Appl. Phys. Lett. 71, p.282 (1997)Google Scholar
12. Shreekala, R., Rajeswari, M., Srivastava, R. C., Ghosh, K., Goyal, A., Srinivasu, V. V., Lofland, S. E., Ghagat, S. M., Downes, M., Sharma, R. P., Ogale, S. B., Greene, R. L., Ramesh, R. and Venkatesan, T., Appl. Phys. Lett. 74, p. 1886(1999)Google Scholar
13. Prellier, W., Rajeswari, M., Venkatesan, T. and Greene, R. L., Appl. Phys. Lett. 75, p. 1446(1999)Google Scholar
14. Li, Y. H., Thomas, K. A., Silva, P. de, Cohen, L. F., Goyal, A., Rajeswari, M., Mathur, N. D., Blamire, M. G., Evetts, J. E., Venkatesan, T. and MacManus-Driscoll, J. L., J. Mater. Res., 13, p.2,161(1998)Google Scholar
15. Hervieu, M., Tendeloo, G. Van, Caignaert, V., Maignan, A. and Raveau, B., Phys. Rev. B 53, p. 14,274(1996)Google Scholar
16. Lebedev, O. I., Tendeloo, G. Van, Amelinckx, S., Leibold, B. and Habermeier, H. U., Phys. Rev. B 58, 8,065 (1998)Google Scholar
17. Millange, F., Caignaert, V., Domenges, B. and Raveau, B., Chem. Mater. 10, p.1,974 (1998)Google Scholar